Suppressed resistance drift from short range order of amorphous GeTe ultrathin films - Ma, Ping; Tong, Hao; Xu, Ming; Cheng, Xiaomin; Miao, Xiangshui (Applied physics letters, 2020)
Keywords: Amorphous materials; Applied physics; Computer memory; Drift; Lithography; Molecular dynamics; Physical properties; Raman spectroscopy; Short range order; Tetrahedra; Thickness; Thin films; Two dimensional materials