Precision measurement of electrical charges in an optomechanical system beyond linearized dynamics
Nonlinear interactions between cavity fields and mechanical oscillation in an optomechanical system coupled to a charged object are treated analytically, and the features of second-order sideband generation are discussed, which is beyond the conventional linearized description of optomechanical inte...
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| Published in | Applied physics letters Vol. 110; no. 17 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
Melville
American Institute of Physics
24.04.2017
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| Abstract | Nonlinear interactions between cavity fields and mechanical oscillation in an optomechanical system coupled to a charged object are treated analytically, and the features of second-order sideband generation are discussed, which is beyond the conventional linearized description of optomechanical interactions. We show that resonantly enhanced feedback-backaction arising from radiation pressure can be substantively modified in the presence of electric interactions, which results in tunable optical nonlinearity and convenient optomechanical control. Especially, the system exhibits a remarkable electrical-charge dependent generation of the frequency component at the second-order sideband, which enables a potentially practical scheme for precision measurement of charges. |
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| AbstractList | Nonlinear interactions between cavity fields and mechanical oscillation in an optomechanical system coupled to a charged object are treated analytically, and the features of second-order sideband generation are discussed, which is beyond the conventional linearized description of optomechanical interactions. We show that resonantly enhanced feedback-backaction arising from radiation pressure can be substantively modified in the presence of electric interactions, which results in tunable optical nonlinearity and convenient optomechanical control. Especially, the system exhibits a remarkable electrical-charge dependent generation of the frequency component at the second-order sideband, which enables a potentially practical scheme for precision measurement of charges. |
| Author | Xiong, Hao Wu, Ying Si, Liu-Gang |
| Author_xml | – sequence: 1 givenname: Hao surname: Xiong fullname: Xiong, Hao email: haoxiong1217@gmail.com organization: School of Physics, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China – sequence: 2 givenname: Liu-Gang surname: Si fullname: Si, Liu-Gang organization: School of Physics, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China – sequence: 3 givenname: Ying surname: Wu fullname: Wu, Ying email: yingwu2@126.com organization: School of Physics, Huazhong University of Science and Technology, Wuhan 430074, People's Republic of China |
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| Title | Precision measurement of electrical charges in an optomechanical system beyond linearized dynamics |
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