A Machine-Learning Approach for the Exemplar Extraction of mmWave Industrial Wireless Channels - Kashef, Mohamed; Vouras, Peter; Jones, Robert D.; Candell, Richard; Remley, Kate A. (IEEE open journal of instrumentation and measurement, 2022)
Keywords: Apertures; Channel modeling; clustering; Delays; exemplar channel; Feature extraction; Industrial Internet of Things; mmWave channels; NIST; unsupervised learning; Wireless communication; Wireless sensor networks; wireless systems