Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression

• Published in: IEEE transactions on computer-aided design of integrated circuits and systems Vol. 35; no. 2; pp. 274 - 284
• Main Authors: Seo, Sungyoul, Lee, Yong, Kang, Sungho
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.02.2016; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Automatic test pattern generation; Circuit faults; Circuits; Coding; Data compression; Design engineering; Encoding; Feedback; Hardware; Mathematical analysis; Mathematical models; Radiation detectors; Reuse; System-on-chip; Test data compression; twisted ring counter; Automatic test equipment (ATE); test data compression; tri-state input; twisted ring counter (TRC); logic testing; tri-state detection; tri-state coding (TSC); system-on-chip (SoC)

As technology processes scale up and design complexities grow, system-on-chip integration continues to rise rapidly. According to these trends, increasing test data volume is one of the biggest challenges in the testing industry. In this paper, we present a new test data compression method based on...