Imaging of Interference between Incident and Reflected Electron Waves at an InAs/GaSb Heterointerface by Low-Temperature Scanning Tunneling Spectroscopy

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 46; no. 4S; p. 2618
Main Authors Suzuki, Kyoichi, Kanisawa, Kiyoshi, Perraud, Simon, Ueki, Mineo, Takashina, Kei, Hirayama, Yoshiro
Format Journal Article
LanguageEnglish
Published 01.04.2007
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.46.2618