Crystal Characterization of Spherical Silicon Solar Cell by X-ray Diffraction

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Published inJapanese Journal of Applied Physics Vol. 45; no. 5R; p. 3933
Main Authors Omae, Satoshi, Minemoto, Takashi, Murozono, Mikio, Takakura, Hideyuki, Hamakawa, Yoshihiro
Format Journal Article
LanguageEnglish
Published 01.05.2006
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Author Murozono, Mikio
Hamakawa, Yoshihiro
Omae, Satoshi
Minemoto, Takashi
Takakura, Hideyuki
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crossref_primary_10_1002_pip_729
crossref_primary_10_4236_epe_2013_52A003
Cites_doi 10.1016/S1359-6454(03)00038-7
10.1063/1.1777100
10.1143/JJAP.44.4820
10.4028/www.scientific.net/SSP.93.249
10.1063/1.1722229
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Title Crystal Characterization of Spherical Silicon Solar Cell by X-ray Diffraction
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