Approaches to Improve Mobility and Stability of IGZO TFTs: A Brief Review - Pan, Zhong; Hu, Yifan; Chen, Jingwen; Wang, Fucheng; Jeong, Yeojin; Pham, Duy Phong; Yi, Junsin (Transactions on electrical and electronic materials, 2024)
Keywords: Chemistry and Materials Science; Electronics and Microelectronics; Instrumentation; Materials Science; Optical and Electronic Materials; Review Paper; 전기공학; IGZO; Annealing; Thin film transistor; Process; Oxygen vacancy; Passivation layer