Lightning impulse voltage and overshoot evaluation proposed in drafts of IEC 60060-1 and future UHV testing
Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not avoidable parasite inductances of the testing circuit provide an oscillation, known as overshoot, at the peak of the lightning impulse (LI). The p...
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Published in | IEEE transactions on dielectrics and electrical insulation Vol. 17; no. 5; pp. 1628 - 1634 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.10.2010
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
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Abstract | Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not avoidable parasite inductances of the testing circuit provide an oscillation, known as overshoot, at the peak of the lightning impulse (LI). The present paper gives an overview of existing and proposed overshoot evaluation methods of LI voltage. An analytic derivation clarifies the relation between an overshoot magnitude- and overshoot magnitude-/duration- considering method. Hence the finding is derived that both methods provide similar results by applying power transformer testing. Moreover the current paper identifies that a higher permitted overshoot is required for UHV testing by keeping the front time of T 1 =1.2 μs. |
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AbstractList | Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not avoidable parasite inductances of the testing circuit provide an oscillation, known as overshoot, at the peak of the lightning impulse (LI). The present paper gives an overview of existing and proposed overshoot evaluation methods of LI voltage. An analytic derivation clarifies the relation between an overshoot magnitude- and overshoot magnitude-/duration- considering method. Hence the finding is derived that both methods provide similar results by applying power transformer testing. Moreover the current paper identifies that a higher permitted overshoot is required for UHV testing by keeping the front time of T 1 =1.2 μs. Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not avoidable parasite inductances of the testing circuit provide an oscillation, known as overshoot, at the peak of the lightning impulse (LI). The present paper gives an overview of existing and proposed overshoot evaluation methods of LI voltage. An analytic derivation clarifies the relation between an overshoot magnitude- and overshoot magnitude-/duration- considering method. Hence the finding is derived that both methods provide similar results by applying power transformer testing. Moreover the current paper identifies that a higher permitted overshoot is required for UHV testing by keeping the front time of T1=1.2 μs. Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not avoidable parasite inductances of the testing circuit provide an oscillation, known as overshoot, at the peak of the lightning impulse (LI). The present paper gives an overview of existing and proposed overshoot evaluation methods of LI voltage. An analytic derivation clarifies the relation between an overshoot magnitude- and overshoot magnitude-/duration- considering method. Hence the finding is derived that both methods provide similar results by applying power transformer testing. Moreover the current paper identifies that a higher permitted overshoot is required for UHV testing by keeping the front time of T sub(1)=1.2 mu s. |
Author | Hauschild, W Gockenbach, E Hinow, M |
Author_xml | – sequence: 1 givenname: M surname: Hinow fullname: Hinow, M organization: HIGHVOLT Pruftechnik Dresden GmbH, Dresden, Germany – sequence: 2 givenname: W surname: Hauschild fullname: Hauschild, W organization: HIGHVOLT Pruftechnik Dresden GmbH, Dresden, Germany – sequence: 3 givenname: E surname: Gockenbach fullname: Gockenbach, E organization: Gottfried Wilhelm Leibniz Univ. Hannover, Hannover, Germany |
BookMark | eNpdkL1OwzAURi0EEr8PgFgsMTClXDtx4oyoFKhUiaVltUxy3QZSu9hOJd4elwIDk23d8_m7Oqfk0DqLhFwyGDEG9e38fjIdcUhPIWohyuqAnDAhZFawXBymO1SQ1bKSx-Q0hDcAVghenpD3WbdcRdvZJe3Wm6EPSLeuj3qJVNuWui36sHIuUtzqftCxc5ZuvNu4gC3tLG29NjFQZ-h0MqYlQAkZ-46aIQ4e6eLphUYMMTWckyOjU8PFz3lGFg-T-fgpmz0_Tsd3s6zJuYiZQa6bQnIsdSvriotC6ApbhiUwhkXZNigq1FKztuVgpJT4KqARwIwpNOT5GbnZ_5sW_RhSt1p3ocG-1xbdEJRMfmpeVlUir_-Rb27wNi2nGOTAcg55kSi2pxrvQvBo1MZ3a-0_E6R29tXOvtrZVz_2U-Zqn-kQ8Y__nX4BbFuBxg |
CODEN | ITDIES |
CitedBy_id | crossref_primary_10_1109_TDEI_2012_6215083 crossref_primary_10_1109_TDEI_2014_6832241 crossref_primary_10_1109_TPWRD_2019_2919733 crossref_primary_10_1063_1_4942910 crossref_primary_10_1109_TDEI_2015_005165 crossref_primary_10_1007_s00502_012_0023_2 crossref_primary_10_1007_s42835_020_00555_x crossref_primary_10_1109_TDEI_2012_6215084 crossref_primary_10_1109_TDEI_2016_7736833 crossref_primary_10_1109_TPWRD_2012_2235862 crossref_primary_10_1109_TDEI_2012_6260015 crossref_primary_10_1109_TPWRD_2015_2448640 crossref_primary_10_1109_TDEI_204_004692 crossref_primary_10_1109_TDEI_2017_006605 |
Cites_doi | 10.1541/ieejpes.129.809 10.1109/TDEI.2009.5211865 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2010 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2010 |
DBID | 97E RIA RIE AAYXX CITATION 7SP 8FD L7M F28 FR3 |
DOI | 10.1109/TDEI.2010.5595567 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Xplore CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Technology Research Database Engineering Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1558-4135 |
EndPage | 1634 |
ExternalDocumentID | 2723948221 10_1109_TDEI_2010_5595567 5595567 |
Genre | orig-research |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS RXW TAE TAF TN5 VH1 XFK AAYXX CITATION 7SP 8FD L7M F28 FR3 |
ID | FETCH-LOGICAL-c325t-fe2ac482e6ad8972545a7ed1e6011e46dce57ea8a1dd20f888eb50c501ff4a033 |
IEDL.DBID | RIE |
ISSN | 1070-9878 |
IngestDate | Sat Aug 17 03:39:13 EDT 2024 Thu Oct 10 16:26:13 EDT 2024 Fri Aug 23 01:06:14 EDT 2024 Wed Jun 26 19:28:48 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 5 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c325t-fe2ac482e6ad8972545a7ed1e6011e46dce57ea8a1dd20f888eb50c501ff4a033 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 1030132034 |
PQPubID | 75745 |
PageCount | 7 |
ParticipantIDs | proquest_miscellaneous_855692677 ieee_primary_5595567 crossref_primary_10_1109_TDEI_2010_5595567 proquest_journals_1030132034 |
PublicationCentury | 2000 |
PublicationDate | 2010-October 2010-10-00 20101001 |
PublicationDateYYYYMMDD | 2010-10-01 |
PublicationDate_xml | – month: 10 year: 2010 text: 2010-October |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on dielectrics and electrical insulation |
PublicationTitleAbbrev | T-DEI |
PublicationYear | 2010 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref8 berlijn (ref5) 2000 (ref3) 1996 (ref2) 2008 ref10 hallström (ref7) 2005 comin (ref4) 2004 (ref11) 0 (ref1) 1989 (ref9) 0 berlijn (ref6) 1999 |
References_xml | – year: 2005 ident: ref7 article-title: Applicability of different implementation of K-factor filtering schemes for the revision of IEC 60060-1 and ?2 publication-title: Intern Sympos High Voltage Engineering (ISH) contributor: fullname: hallström – ident: ref10 doi: 10.1541/ieejpes.129.809 – year: 1996 ident: ref3 publication-title: IEC 61083-2 Instruments and software used for measurements in high-voltage impulse test - Part 2 Requirements for software – ident: ref8 doi: 10.1109/TDEI.2009.5211865 – year: 2008 ident: ref2 publication-title: IEC TC 42 Maintenance Team Committee Draft for Voting 42/236 CDV High-voltage Test Techniques Part 1 General definitions and test requirements – year: 2004 ident: ref4 publication-title: Research of Characteristic Parameters of the Behavior of Dielectric Media under non standard Lighting Impulses in High Voltage contributor: fullname: comin – year: 1999 ident: ref6 publication-title: "Final report "Digital measurement of parameters used for lightning impulse tests for high voltage equipment" EU contract no PL-951210-SMT-CT96-2132 contributor: fullname: berlijn – year: 0 ident: ref11 publication-title: PSpice Release 9 1 Simulation software for electrical-circuits – year: 1989 ident: ref1 publication-title: IEC 60060-1 High-voltage Test Techniques Part 1 General definitions and test requirements – year: 2000 ident: ref5 publication-title: Influence of Lightning Impulses to Insulation Systems contributor: fullname: berlijn – year: 0 ident: ref9 publication-title: IEC Document Committee Draft IEC 60060-1 42/224 CD (04/2007) |
SSID | ssj0014526 |
Score | 2.148208 |
Snippet | Lightning impulse (LI) voltage testing is an indispensable method for quality assurance of high voltage (HV) and ultra high voltage (UHV) insulation. Not... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 1628 |
SubjectTerms | Derivation Electric potential Electrical insulation Equations Generators High voltages IEC standards Impulses Insulation k-factor Lightning Lightning impulse Mathematical analysis Oscillators overshoot Power transformers Testing ultra high voltage testing Voltage |
Title | Lightning impulse voltage and overshoot evaluation proposed in drafts of IEC 60060-1 and future UHV testing |
URI | https://ieeexplore.ieee.org/document/5595567 https://www.proquest.com/docview/1030132034 https://search.proquest.com/docview/855692677 |
Volume | 17 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB61lSrBodAW1IWCfOCEmq3zcB5HVLbaIsqpW_UWOfYYqqrJqkku_HpmnGxogQO3KIkty2OP5_N8MwPwoSKbm84JGWRVpQmgpLTnXFgFoXNxFSc2UZJjhy-_pctV8uVG3WzByRQLg4iefIZzfvS-fNuYnq_KTsn6VSrNtmE7K4ohVmvyGHCp7IFfKAPC0fnowQxlcXr1eXExkLjGDp6cQb6oyl-a2B8v5y_gcjOwgVVyN--7am5-_pGz8X9H_hL2RjtTfBoWxj5sYX0Azx9lHzyAXc_-NO0h3H1liM43JOL2ft3TaSlIa3WkaoSurWCWZ_ujaTrxOze4WHN5hRatuK2FfdCua0XjxMXiTKScfSUIfdMhZYlYLa9Fx_k86u-vYHW-uDpbBmMVhsDEkeoCh5E2SR5hqm1eZAQolc7QhkhQLsQktQZVhjrXobWRdISosVLSKEniTrSM49ewUzc1HoEIC2tJYWjpUpMwONYyMs45bYtYk-0zg48buZTrIdlG6UGKLEoWYslCLMe5nMEhz_P04_T6eCPJctyObcm11DhWPE5mIKbPtJHYO6JrbPq2zKl1EaVZ9ubfHb-FZ5454Il8x7DTPfT4jgySrnrvV-IvQv7clg |
link.rule.ids | 315,783,787,799,27936,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB6VIgQcSmmLWPrAh54Q2ToPO8kRla12y25Pu6g3y_EDqqrJqkku_HrGTjZQyqG3KIkty2OP5_N8MwNwWqDNjecEDdKikAhQOO45GxZBaG1cxIlOGHWxw4srPl0ll9fsegs-D7EwxhhPPjNj9-h9-bpSrbsqO0PrlzGePoPnaFdnvIvWGnwGrlh2xzCkASLprPdhhjQ_W36dzDoaV9_Fg1PIl1V5pIv9AXPxBhaboXW8kttx2xRj9eufrI1PHfsu7PSWJvnSLY23sGXKPXj9V_7BPXjh-Z-q3ofbuQPp7o6E3NytWzwvCeqtBpUNkaUmjudZ_6yqhvzJDk7WrsBCbTS5KYm-l7apSWXJbHJOuMu_EoS-aZe0hKym30njMnqUPw5gdTFZnk-Dvg5DoOKINYE1kVRJFhkudZanCCmZTI0ODYK50CRcK8NSIzMZah1Ri5jaFIwqRlHgiaRx_A62y6o074GEudaoMiS1XCUOHksaKWut1Hks0foZwaeNXMS6S7chPEyhuXBCFE6Iop_LEey7eR5-HF4fbSQp-g1ZC1dNzUWLx8kIyPAZt5Lzj8jSVG0tMmydRzxNP_y_44_wcrpczMV8dvXtEF55HoGn9R3BdnPfmmM0T5rixK_K3_Ju3-E |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Lightning+impulse+voltage+and+overshoot+evaluation+proposed+in+drafts+of+IEC+60060-1+and+future+UHV+testing&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Hinow%2C+M&rft.au=Hauschild%2C+W&rft.au=Gockenbach%2C+E&rft.date=2010-10-01&rft.pub=IEEE&rft.issn=1070-9878&rft.eissn=1558-4135&rft.volume=17&rft.issue=5&rft.spage=1628&rft.epage=1634&rft_id=info:doi/10.1109%2FTDEI.2010.5595567&rft.externalDocID=5595567 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon |