Nanoparticle-assisted stabilization of metal species as an alternative to conventional approaches for avoiding volatilization errors in total reflection X-ray fluorescence: A review

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy Vol. 168; p. 105843
• Main Authors: de la Calle, Inmaculada, Romero, Vanesa, Lavilla, Isela, Bendicho, Carlos
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier B.V 01.06.2020; Elsevier BV
• Subjects: Anlayte losses; Arsenic; Atomic properties; Cadmium; Chlorides; Evaporation; Fluorescence; Fluorides; Graphene; Halogens; Heavy metals; Immobilization; Membranes; Mercury; Mercury (metal); Nanomaterials; Nanoparticle-assisted stabilization; Nanoparticles; Nanotechnology; Oxides; Quartz; Reflection; Reflectors; Sample preparation; Sample pretreatment; Selenium; Slurries; Spectrometry; Thin films; Total reflection X-ray fluorescence; Trapping strategies; Volatile elements; Volatility; Volatilization; X ray fluorescence analysis; X ray reflection; X rays; X-ray fluorescence; Volatile elements; Anlayte losses; Nanoparticle-assisted stabilization; Total reflection X-ray fluorescence; Sample pretreatment; Trapping strategies

Total Reflection X-Ray Fluorescence spectrometry (TXRF) provides many advantages for metal and metalloid analysis. In general, the sample should be prepared as a thin film. To that end, for the analysis of liquid, suspensions or solids previously digested, a small aliquot of the sample is dropped on...