An ASIC chip with pipeline ADCs for CCD sensor imaging system
•Designing a specific integrated circuit is used to TDI CCD imaging system.•Designing a high-resolution and high-throughput pipeline ADC with ASIC.•Analyzing some non-ideal factors for ADC designing.•Achieving a high SNR CCD imaging system. This paper introduces the design of an application specific...
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Published in | Sensors and actuators. A. Physical. Vol. 279; pp. 284 - 292 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Lausanne
Elsevier B.V
15.08.2018
Elsevier BV |
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Abstract | •Designing a specific integrated circuit is used to TDI CCD imaging system.•Designing a high-resolution and high-throughput pipeline ADC with ASIC.•Analyzing some non-ideal factors for ADC designing.•Achieving a high SNR CCD imaging system.
This paper introduces the design of an application specific integrated circuit (ASIC). It will conduct the image processing for photoelectric image sensor charge coupled device (CCD). The ASIC can convert the analog signal of CCD into a suitable digital signal, which is used as the input for the next stage. To realize the ASIC, a two-channel analog to digital converter (ADC) with the speed of 40 MS/s-100 MS/s and a low voltage differential signaling (LVDS) has been proposed. In the ASIC, the correlated double sampling (CDS) has been integrated into the programmable gain amplifier (PGA). A novel CDS circuit is employed to reduce the amplifier gain error. The unique design reduces the size of ASIC by sharing the same operational amplifier (OPA) block. In the low sampling rate of 40 MHz, the spurious-free dynamic range (SFDR) is larger than 91 dB, and the signal-to-noise-ratio (SNR) is more than 79 dB. In the high sampling rate of 100 MHz, the ADC achieved a high SFDR of 92.2 dB and SNR of 81.47 dB. With a 0.13-μm 1P-6M CMOS process, the ASIC only occupies on the die with a size of 21.16 mm2. With the power supply of 3.3 V and 1.8 V, the power consumption is as low as 405 mW. By using the ASIC with the specially designed ADC, the saturated output image reaches a high SNR of 52.2 dB. |
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AbstractList | •Designing a specific integrated circuit is used to TDI CCD imaging system.•Designing a high-resolution and high-throughput pipeline ADC with ASIC.•Analyzing some non-ideal factors for ADC designing.•Achieving a high SNR CCD imaging system.
This paper introduces the design of an application specific integrated circuit (ASIC). It will conduct the image processing for photoelectric image sensor charge coupled device (CCD). The ASIC can convert the analog signal of CCD into a suitable digital signal, which is used as the input for the next stage. To realize the ASIC, a two-channel analog to digital converter (ADC) with the speed of 40 MS/s-100 MS/s and a low voltage differential signaling (LVDS) has been proposed. In the ASIC, the correlated double sampling (CDS) has been integrated into the programmable gain amplifier (PGA). A novel CDS circuit is employed to reduce the amplifier gain error. The unique design reduces the size of ASIC by sharing the same operational amplifier (OPA) block. In the low sampling rate of 40 MHz, the spurious-free dynamic range (SFDR) is larger than 91 dB, and the signal-to-noise-ratio (SNR) is more than 79 dB. In the high sampling rate of 100 MHz, the ADC achieved a high SFDR of 92.2 dB and SNR of 81.47 dB. With a 0.13-μm 1P-6M CMOS process, the ASIC only occupies on the die with a size of 21.16 mm2. With the power supply of 3.3 V and 1.8 V, the power consumption is as low as 405 mW. By using the ASIC with the specially designed ADC, the saturated output image reaches a high SNR of 52.2 dB. This paper introduces the design of an application specific integrated circuit (ASIC). It will conduct the image processing for photoelectric image sensor charge coupled device (CCD). The ASIC can convert the analog signal of CCD into a suitable digital signal, which is used as the input for the next stage. To realize the ASIC, a two-channel analog to digital converter (ADC) with the speed of 40 MS/s-100 MS/s and a low voltage differential signaling (LVDS) has been proposed. In the ASIC, the correlated double sampling (CDS) has been integrated into the programmable gain amplifier (PGA). A novel CDS circuit is employed to reduce the amplifier gain error. The unique design reduces the size of ASIC by sharing the same operational amplifier (OPA) block. In the low sampling rate of 40 MHz, the spurious-free dynamic range (SFDR) is larger than 91 dB, and the signal-to-noise-ratio (SNR) is more than 79 dB. In the high sampling rate of 100 MHz, the ADC achieved a high SFDR of 92.2 dB and SNR of 81.47 dB. With a 0.13-μm 1P-6M CMOS process, the ASIC only occupies on the die with a size of 21.16 mm2. With the power supply of 3.3 V and 1.8 V, the power consumption is as low as 405 mW. By using the ASIC |
Author | Sun, Zhenya Zhang, Da Fang, Wei |
Author_xml | – sequence: 1 givenname: Zhenya surname: Sun fullname: Sun, Zhenya email: szy_shine@foxmail.com organization: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China – sequence: 2 givenname: Da surname: Zhang fullname: Zhang, Da email: mrzhangda@126.com.cn organization: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China – sequence: 3 givenname: Wei surname: Fang fullname: Fang, Wei email: Fangw@ciomp.ac.cn organization: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China |
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Cites_doi | 10.3390/s17061441 10.1109/JSSC.2015.2463094 10.1109/JSSC.2015.2464684 10.1002/j.1538-7305.1970.tb01790.x 10.3390/s16081159 10.1109/JSSC.2006.875291 10.1016/j.infrared.2013.12.013 10.1016/0924-4247(94)00900-3 10.1109/TCE.2009.5373800 10.1109/JSSC.2015.2436875 10.1109/JSSC.2015.2415472 10.1016/j.sna.2006.06.041 10.1109/JSSC.2015.2453332 10.1016/S0924-4247(02)00041-9 10.1093/mnras/258.3.543 10.1109/JSSC.2004.836232 10.1016/S1350-4495(99)00048-1 10.3390/s17040935 |
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Snippet | •Designing a specific integrated circuit is used to TDI CCD imaging system.•Designing a high-resolution and high-throughput pipeline ADC with ASIC.•Analyzing... This paper introduces the design of an application specific integrated circuit (ASIC). It will conduct the image processing for photoelectric image sensor... |
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SubjectTerms | ADC Amplification Analog to digital conversion Analog to digital converters Application specific integrated circuits ASIC CCD CDS Charge coupled devices Circuit design Circuits CMOS Electricity Gain Image processing Integrated circuits Low voltage Noise levels Operational amplifiers Photoelectric sensor Photoelectricity Power consumption Power supplies Sampling Sensors |
Title | An ASIC chip with pipeline ADCs for CCD sensor imaging system |
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