Aging effect on insulation reliability evaluation with weibull distribution for oil-immersed transformers
In the condition settings of a power-frequency withstand voltage test for substation equipment, an approach based on insulation reliability evaluation using Weibull distribution is available. However, the subjects which should be investigated remains in this method. One of the subjects is that evalu...
Saved in:
Published in | IEEE transactions on dielectrics and electrical insulation Vol. 17; no. 6; pp. 1869 - 1876 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.12.2010
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | In the condition settings of a power-frequency withstand voltage test for substation equipment, an approach based on insulation reliability evaluation using Weibull distribution is available. However, the subjects which should be investigated remains in this method. One of the subjects is that evaluating the insulated reliability for temporary overvoltage caused in an aged equipment by the pre-aging Weibull parameter. In the first place, for an oil-immersed transformer, the breakdown voltage-time (V-t) characteristics of the oil gap were obtained as basic characteristics in the previous experiment. In this experiment the presence or absence of the oil flow was used as a parameter affecting the history of the applied voltage. Also, the validity of the present evaluation approach to temporary overvoltage during operation was examined. In this paper, an insulation characteristic was obtained in consideration of the age-related deterioration in the field. The results were then analyzed in comparison with the insulation characteristics of a new insulating oil. As a result, there was little change affecting the result of insulation reliability evaluation in the Weibull parameters. Consequently, it is reasonable to evaluate the insulation reliability by the V-t characteristic of the new insulating oil. |
---|---|
AbstractList | In the condition settings of a power-frequency withstand voltage test for substation equipment, an approach based on insulation reliability evaluation using Weibull distribution is available. However, the subjects which should be investigated remains in this method. One of the subjects is that evaluating the insulated reliability for temporary overvoltage caused in an aged equipment by the pre-aging Weibull parameter. In the first place, for an oil-immersed transformer, the breakdown voltage-time (V-t) characteristics of the oil gap were obtained as basic characteristics in the previous experiment. In this experiment the presence or absence of the oil flow was used as a parameter affecting the history of the applied voltage. Also, the validity of the present evaluation approach to temporary overvoltage during operation was examined. In this paper, an insulation characteristic was obtained in consideration of the age-related deterioration in the field. The results were then analyzed in comparison with the insulation characteristics of a new insulating oil. As a result, there was little change affecting the result of insulation reliability evaluation in the Weibull parameters. Consequently, it is reasonable to evaluate the insulation reliability by the V-t characteristic of the new insulating oil. |
Author | Tsuboi, Toshihiro Takami, Jun Aono, Kazuaki Inami, Kiyoshi Okabe, Shigemitsu |
Author_xml | – sequence: 1 givenname: Toshihiro surname: Tsuboi fullname: Tsuboi, Toshihiro organization: High Voltage & Insulation Group, Tokyo Electr. Power Co., Yokohama, Japan – sequence: 2 givenname: Jun surname: Takami fullname: Takami, Jun organization: High Voltage & Insulation Group, Tokyo Electr. Power Co., Yokohama, Japan – sequence: 3 givenname: Shigemitsu surname: Okabe fullname: Okabe, Shigemitsu organization: High Voltage & Insulation Group, Tokyo Electr. Power Co., Yokohama, Japan – sequence: 4 givenname: Kiyoshi surname: Inami fullname: Inami, Kiyoshi organization: Mitsubishi Electr. Corp., Ako, Japan – sequence: 5 givenname: Kazuaki surname: Aono fullname: Aono, Kazuaki organization: Mitsubishi Electr. Corp., Ako, Japan |
BookMark | eNpdkE9PwzAMxSM0JDbgAyAulThwKiRpnLTHafyVkLjAucpSZwRlLSQt0749KRscOPnZ_vnJejMyabsWCTlj9IoxWl2_3Nw-XnGaWpBQckEPyJQBlLlgBUySpormVanKIzKL8Z1SJoDLKXHzlWtXGVqLps-6NnNtHLzuXZIBvdNL512_zfBL-2E33rj-LdugWw7eZ42LfUjyZ2O7kHXO5269xhCxyfqg25imY3tCDq32EU_39Zi83t2-LB7yp-f7x8X8KTcFhz4XWjZKGCqBK4qgVVUKJgEqbY0wttTCqIqLBsGgBW4BmGxogZxLZZeMFsfkcuf7EbrPAWNfr1006L1usRtiXQJIJSsQibz4R753Q2jTc3XyoUypsioSxXaUCV2MAW39Edxah22C6jH7esy-HrOv99mnm_PdjUPEP_53-w3nNIM0 |
CODEN | ITDIES |
CitedBy_id | crossref_primary_10_1109_TDEI_2012_6260017 crossref_primary_10_5370_JEET_2014_9_3_957 crossref_primary_10_3390_en11010249 crossref_primary_10_1007_s42835_022_01281_2 crossref_primary_10_1109_TDEI_2016_005565 crossref_primary_10_1049_iet_smt_2016_0061 crossref_primary_10_1108_WJE_10_2023_0446 |
Cites_doi | 10.1109/TEI.1987.298936 10.1109/TDEI.2008.4656231 10.1109/TDEI.2010.5492254 10.1541/ieejfms1990.113.11_791 10.1109/TDEI.2010.5595571 10.1109/TDEI.2010.5492275 10.2307/3214067 10.1109/TDEI.2010.5412029 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2010 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2010 |
DBID | 97E RIA RIE AAYXX CITATION 7SP 8FD L7M F28 FR3 |
DOI | 10.1109/TDEI.2010.5658240 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library Online CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Engineering Research Database Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1558-4135 |
EndPage | 1876 |
ExternalDocumentID | 2724314421 10_1109_TDEI_2010_5658240 5658240 |
Genre | orig-research |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS RXW TAE TAF TN5 VH1 XFK AAYXX CITATION 7SP 8FD L7M F28 FR3 |
ID | FETCH-LOGICAL-c325t-4a6d74c065270e5a798416559afc4cf8a4c7924de5cef52f5516d03e2267fb103 |
IEDL.DBID | RIE |
ISSN | 1070-9878 |
IngestDate | Fri Aug 16 10:53:20 EDT 2024 Fri Sep 13 02:16:23 EDT 2024 Fri Aug 23 01:06:14 EDT 2024 Wed Jun 26 19:28:50 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 6 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c325t-4a6d74c065270e5a798416559afc4cf8a4c7924de5cef52f5516d03e2267fb103 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
PQID | 1030177893 |
PQPubID | 75745 |
PageCount | 8 |
ParticipantIDs | ieee_primary_5658240 crossref_primary_10_1109_TDEI_2010_5658240 proquest_journals_1030177893 proquest_miscellaneous_855676954 |
PublicationCentury | 2000 |
PublicationDate | 2010-Dec. 2010-12-00 20101201 |
PublicationDateYYYYMMDD | 2010-12-01 |
PublicationDate_xml | – month: 12 year: 2010 text: 2010-Dec. |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on dielectrics and electrical insulation |
PublicationTitleAbbrev | T-DEI |
PublicationYear | 2010 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref8 ref7 ref4 hauschild (ref6) 1992 ref3 ref11 kawamura (ref2) 1990 ref10 ref5 abernethy (ref1) 2007 kohtoh (ref9) 2010; 17 |
References_xml | – ident: ref4 doi: 10.1109/TEI.1987.298936 – ident: ref11 doi: 10.1109/TDEI.2008.4656231 – ident: ref10 doi: 10.1109/TDEI.2010.5492254 – ident: ref5 doi: 10.1541/ieejfms1990.113.11_791 – ident: ref8 doi: 10.1109/TDEI.2010.5595571 – ident: ref7 doi: 10.1109/TDEI.2010.5492275 – ident: ref3 doi: 10.2307/3214067 – year: 1992 ident: ref6 publication-title: Statistical Techniques for HV Engineering contributor: fullname: hauschild – year: 2007 ident: ref1 article-title: The New Weibull Handbook: Reliability & Statistical Analysis for Predicting Life, Safety, Survivability, Risk, Cost and Warranty Claims publication-title: The Reliability Information Analysis Center For example contributor: fullname: abernethy – start-page: 33 year: 1990 ident: ref2 article-title: Temporary Overvoltage and AC Test Voltage in 550kV System with Reduced Insulation Level contributor: fullname: kawamura – volume: 17 start-page: 287 year: 2010 ident: ref9 article-title: Investigation of Electrostatic Charging Mechanism in Aged Oil-immersed Transformers publication-title: IEEE Trans Dielectr Electr Insul doi: 10.1109/TDEI.2010.5412029 contributor: fullname: kohtoh |
SSID | ssj0014526 |
Score | 2.0584834 |
Snippet | In the condition settings of a power-frequency withstand voltage test for substation equipment, an approach based on insulation reliability evaluation using... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 1869 |
SubjectTerms | Aging breakdown (partial discharge inception) voltage-time characteristics degradation Electric potential Electrical insulation Heating Insulation Overvoltage Petroleum Power-frequency withstand voltage test Reliability reliability evaluation Studies Substations Transformers Vanadium Voltage Voltage measurement Weibull distribution Weibull distributions |
Title | Aging effect on insulation reliability evaluation with weibull distribution for oil-immersed transformers |
URI | https://ieeexplore.ieee.org/document/5658240 https://www.proquest.com/docview/1030177893/abstract/ https://search.proquest.com/docview/855676954 |
Volume | 17 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8QwEB5UEPTgaxVXV8nBk9jdbpu02aOoyyroSWFvJU2mUJRW3C6iv95J2q3Pg7f0QQiZJPPNzJcZgBOJhnB3qr0IpfK4MsJLDbXCNEPkpIAMt5eTb--iyQO_mYrpEpy1d2EQ0ZHPsG-bLpZvSj23rrIBgQ9JGmgZlqUf1He12oiBLZVd8wt9j-xo2UQwh_5ocH95dV2TuJoOvukgV1Tl10ns1Mt4E24XA6tZJY_9eZX29fuPnI3_HfkWbDQ4k53XC2MblrDYgfUv2Qd3YNWxP_WsA_m5LVXEam4HKwvmGOpOZuwFn_I6l_cb-0wNzqz_lr1inpIJy4zNvtsUzmKEglmZP3m5c4mjYdUCG9PjLjyMr-4vJl5Tg8HTYSAqkl5kYq4JqASxj0LFIxunJDNEZZrrTCquYzLhDAqNmQgyG3czfoiE6uIsHfrhHqwUZYH7wMgSjWSQRTrAkCtFJ8fQJw0dypi6klp14XQhleS5TrWROBPFHyVWhIkVYdLMZBc6dpbbH9vXvYUck2YzzhJbSW0Yx4TMusDaz7SNbGxEFVjOZ4kUwpJ9BT_4u-NDWAtaIksPVqqXOR4RHKnSY7cOPwBNKd7m |
link.rule.ids | 315,786,790,802,27957,27958,55109 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB7xUAUceFcs5eFDT4gs2cROvEdEQctjOS0SN8uxJ1IESio2K0R_fcdONrS0B25ObFmWx_Z84_k8A_BdoiXcnZkgQakDrq0IMkulOMsROSkgy93j5PF9MnrgN4_icQFOu7cwiOjJZ9h3Re_Lt5WZuauyMwIfkjTQIiyTng-HzWutzmfgkmU3DMMwIEtatj5Mang2-XF53dC42i7-0kI-rco_Z7FXMFcbMJ4PreGVPPVnddY3vz5Ebfzs2DdhvUWa7LxZGluwgOU2rP0Rf3Abvnj-p5nuQHHukhWxht3BqpJ5jrqXGnvB56KJ5v3G3oODM3eDy16xyMiIZdbF321TZzHCwawqnoPCX4qjZfUcHdPnLjxcXU4uRkGbhSEwcSRqkl9iU24IqkRpiEKnQ-epJENE54abXGpuUjLiLAqDuYhy53mzYYyE69I8G4TxV1gqqxL3gJEtmsgoT0yEMdeazo5BSDo6lil1JY3uwclcKupnE2xDeSMlHConQuVEqNqZ7MGOm-WuYff7YC5H1W7HqXK51AZpStisB6yrpo3kvCO6xGo2VVIIR_cVfP__HR_DymgyvlN31_e332A16mgtB7BUv8zwkMBJnR35NfkbNobiPA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Aging+effect+on+insulation+reliability+evaluation+with+weibull+distribution+for+oil-immersed+transformers&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Tsuboi%2C+Toshihiro&rft.au=Takami%2C+Jun&rft.au=Okabe%2C+Shigemitsu&rft.au=Inami%2C+Kiyoshi&rft.date=2010-12-01&rft.issn=1070-9878&rft.volume=17&rft.issue=6&rft.spage=1869&rft.epage=1876&rft_id=info:doi/10.1109%2FTDEI.2010.5658240&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TDEI_2010_5658240 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon |