Finite-Length Bounds on Hypothesis Testing Subject to Vanishing Type I Error Restrictions
A central problem in Binary Hypothesis Testing (BHT) is to determine the optimal tradeoff between the Type I error (referred to as false alarm) and Type II (referred to as miss) error. In this context, the exponential rate of convergence of the optimal miss error probability - as the sample size ten...
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Published in | IEEE signal processing letters Vol. 28; pp. 229 - 233 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.01.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers |
Subjects | |
Online Access | Get full text |
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