Process Capability Sensitivity Analysis for Design Evaluation of Multistage Assembly Processes

• Published in: IEEE transactions on automation science and engineering Vol. 7; no. 4; pp. 736 - 745
• Main Authors: Huang, Wenzhen, Kong, Zhenyu
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.10.2010; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithm design and analysis; Algorithms; Assembly; Assembly lines; Automation; Automotive engineering; Calculus; Computer simulation; Derivatives; Design engineering; Design for quality; Design parameters; Finite difference methods; Manufacturing processes; Monte Carlo methods; Multistage; Parameter identification; process capability; Process controls; sensitivity; Sensitivity analysis; tolerance; Uncertainty; Yield estimation

Yield-based sensitivity analysis methods and algorithms are developed for process capability evaluation in this paper. Yield, the conformity to product specifications, is subject to critical design parameters such as dimensions, tolerances, and specification limits. The uncertainties in determining...