Measurement of Temperature-Dependent Relaxation Oscillation Frequency and Linewidth Enhancement Factor of a 1550 nm VCSEL - Khan, Nadir Ali; Schires, Kevin; Hurtado, Antonio; Henning, Ian D.; Adams, Michael J. (IEEE journal of quantum electronics, 2013)
Keywords: Current measurement; Frequency measurement; Linewidth enhancement factor; Optical polarization; Polarization; Quantum electronics; relaxation oscillation frequency (ROF); Relaxation oscillations; semiconductor lasers; Temperature distribution; Temperature measurement; Vertical cavity surface emission lasers; Vertical cavity surface emitting lasers; vertical-cavity surface-emitting lasers (VCSELs); Wavelengths