Kinship Measurement on Salient Facial Features
Humans have the capability to recognize family members. Phrases such as "John has his father's nose" or "Joe has his mother's eyes" are quite common. Motivated by this, we consider the following question: Is it possible to develop a method to extract the salient familia...
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Published in | IEEE transactions on instrumentation and measurement Vol. 61; no. 8; pp. 2322 - 2325 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.08.2012
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
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Abstract | Humans have the capability to recognize family members. Phrases such as "John has his father's nose" or "Joe has his mother's eyes" are quite common. Motivated by this, we consider the following question: Is it possible to develop a method to extract the salient familial traits in face images for kinship recognition? If this idea works, an instrument may be invented to measure familial relationships. This computational kinship measurement might have a large impact in real applications, such as child adoptions, trafficking/smuggling of children, and finding missing children. The novel problem is related to but very different from traditional face recognition. It is more challenging than a typical face recognition problem since we need to find subtle features that are reliable across a large span of ages (e.g., grandfather and grandson) and sex difference (e.g., mother and son). A recently developed descriptor, i.e., DAISY, is adapted to our problem to represent the salient features, and a dynamic scheme is developed to stochastically combine familial traits. Experiments are performed on a database to show that our new approach can perform reasonably well for kinship verification. The encouraging result may inspire further research on this emerging problem. |
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AbstractList | Humans have the capability to recognize family members. Phrases such as "John has his father's nose" or "Joe has his mother's eyes" are quite common. Motivated by this, we consider the following question: Is it possible to develop a method to extract the salient familial traits in face images for kinship recognition? If this idea works, an instrument may be invented to measure familial relationships. This computational kinship measurement might have a large impact in real applications, such as child adoptions, trafficking/smuggling of children, and finding missing children. The novel problem is related to but very different from traditional face recognition. It is more challenging than a typical face recognition problem since we need to find subtle features that are reliable across a large span of ages (e.g., grandfather and grandson) and sex difference (e.g., mother and son). A recently developed descriptor, i.e., DAISY, is adapted to our problem to represent the salient features, and a dynamic scheme is developed to stochastically combine familial traits. Experiments are performed on a database to show that our new approach can perform reasonably well for kinship verification. The encouraging result may inspire further research on this emerging problem. |
Author | Xiaolong Wang Guodong Guo |
Author_xml | – sequence: 1 givenname: Guodong surname: Guo fullname: Guo, Guodong – sequence: 2 givenname: Xiaolong surname: Wang fullname: Wang, Xiaolong |
BookMark | eNp9kL9LAzEUgINUsK3ugsuBi8vV_Lj8GqVYLbY4WOcjTV4x5Zqryd3gf29Ki0MHpzzI9z0e3wgNQhsAoVuCJ4Rg_biaLycUEzqhRMlKqAs0JJzLUgtBB2iIMVGlrri4QqOUthhjKSo5RJM3H9KX3xdLMKmPsIPQFW0oPkzjD-PMWG-aYgamy7_pGl1uTJPg5vSO0efseTV9LRfvL_Pp06K0jFZdyTTBzhIM1K1h7bTCRDi1FlobyrjSYEFQZw1zRnDDlCPWOVFxvSESAEs2Rg_HvfvYfveQunrnk4WmMQHaPtUEM0VZJSnN6P0Zum37GPJ1maJcKlEpnSlxpGxsU4qwqa3vTOfb0EXjm4zWh4x1zlgfMtanjFnEZ-I--p2JP_8pd0fFA8AfLgiXgmj2C_x7fZk |
CODEN | IEIMAO |
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Cites_doi | 10.1016/j.visres.2008.09.025 10.1109/ICPR.1994.576361 10.1109/ICIP.2010.5652590 10.1007/BF02983936 10.1177/0956797610388045 10.1109/CVPR.2001.990517 10.1145/1854229.1854249 10.1098/rspb.2009.0677 10.1167/10.8.9 10.1167/6.12.2 10.1109/TPAMI.2009.77 10.1167/9.6.23 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2012 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Aug 2012 |
DBID | 97E RIA RIE AAYXX CITATION 7SP 7U5 8FD L7M F28 FR3 |
DOI | 10.1109/TIM.2012.2187468 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Xplore CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Solid State and Superconductivity Abstracts Solid State and Superconductivity Abstracts |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1557-9662 |
EndPage | 2325 |
ExternalDocumentID | 2712141541 10_1109_TIM_2012_2187468 6157619 |
Genre | orig-research |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 85S 8WZ 97E A6W AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS TN5 TWZ VH1 VJK AAYOK AAYXX CITATION RIG 7SP 7U5 8FD L7M F28 FR3 |
ID | FETCH-LOGICAL-c324t-3910dc10e2dbebd98016d8b699a23589ece62dca3da65a38d1cdd6459f17ee073 |
IEDL.DBID | RIE |
ISSN | 0018-9456 |
IngestDate | Fri Jul 11 01:55:38 EDT 2025 Mon Jun 30 10:24:40 EDT 2025 Thu Apr 24 22:59:40 EDT 2025 Tue Jul 01 02:02:21 EDT 2025 Tue Aug 26 17:18:12 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 8 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c324t-3910dc10e2dbebd98016d8b699a23589ece62dca3da65a38d1cdd6459f17ee073 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 content type line 23 |
PQID | 1025786489 |
PQPubID | 85462 |
PageCount | 4 |
ParticipantIDs | proquest_journals_1025786489 ieee_primary_6157619 crossref_primary_10_1109_TIM_2012_2187468 crossref_citationtrail_10_1109_TIM_2012_2187468 proquest_miscellaneous_1038234722 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2012-08-01 |
PublicationDateYYYYMMDD | 2012-08-01 |
PublicationDate_xml | – month: 08 year: 2012 text: 2012-08-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on instrumentation and measurement |
PublicationTitleAbbrev | TIM |
PublicationYear | 2012 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref8 ref12 ref7 ref9 ref4 ref3 ref6 ref11 ref10 ref5 ref2 ref1 |
References_xml | – ident: ref4 doi: 10.1016/j.visres.2008.09.025 – ident: ref5 doi: 10.1109/ICPR.1994.576361 – ident: ref6 doi: 10.1109/ICIP.2010.5652590 – ident: ref7 doi: 10.1007/BF02983936 – ident: ref9 doi: 10.1177/0956797610388045 – ident: ref12 doi: 10.1109/CVPR.2001.990517 – ident: ref11 doi: 10.1145/1854229.1854249 – ident: ref8 doi: 10.1098/rspb.2009.0677 – ident: ref3 doi: 10.1167/10.8.9 – ident: ref2 doi: 10.1167/6.12.2 – ident: ref10 doi: 10.1109/TPAMI.2009.77 – ident: ref1 doi: 10.1167/9.6.23 |
SSID | ssj0007647 |
Score | 2.3671021 |
Snippet | Humans have the capability to recognize family members. Phrases such as "John has his father's nose" or "Joe has his mother's eyes" are quite common. Motivated... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 2322 |
SubjectTerms | Accuracy Children Computational recognition DAISY Eyes Face Face recognition familial traits Feature extraction Humans Instrumentation kinship measurement Nose Recognition salient parts Smuggling |
Title | Kinship Measurement on Salient Facial Features |
URI | https://ieeexplore.ieee.org/document/6157619 https://www.proquest.com/docview/1025786489 https://www.proquest.com/docview/1038234722 |
Volume | 61 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LSwMxEB6qIOjBR1WsL1bwIrjb7qPp5ihi8UG92EJvSx6zIMpWbHvx1zuT3a5FRbwFks2GTDLzTeYFcJ7kqc61C45JOCRHoy-FUn5HGi21zG2EHJw8eBS3o-R-3B034LKOhUFE53yGATedLd9OzJyfytokfVnrXoEVUtzKWK2a6_ZEUubHDOkCEypYmCQ7sj28G7APVxREXICOk6ouiSBXU-UHI3bSpb8Fg8W6SqeSl2A-04H5-Jay8b8L34bNCmZ6V-W52IEGFk3YWEo-2IQ15_xpprsQPDw7py1v8PVg6E0K74kwOjf7it_VPUaL1Dvdg1H_Znh961d1FHxDcGnmxwQJrAk7GFmN2koSSsKmWkipOFBWokERWaNiq0RXxakNjbWcZCYPe4jEA_ZhtZgUeABeiLGKhegpExnSPLtSR5oAFNo0DXPZ1S1oL7Y2M1WSca518Zo5ZaMjMyJGxsTIKmK04KL-4q1MsPHH2F3e23pcta0tOF5QL6tu4JTmYGYkkpS6z-puujtsEFEFTuY8hq2gnC7z8PeZj2Cd_186_B3D6ux9jicEQmb61J2-T10p1wY |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lj9MwEB6VIgR74NEu2i4FgsQFiaTNy42PCFG1tOmFVuot8mMiIVYpou1lf_3OOGm2AoS4RbJjWR575rNn5huA90mZ6VK75JiEU3I0-lIo5Y-l0VLL0kbIycn5Ssw2yddtuu3AxzYXBhFd8BkG_Ol8-XZnjvxUNiLry7fuB_CQ7H4a1tlard6diKRmyAzpCBMuODklx3K0nuccxRUFEZegY1rVMyPkqqr8oYqdfZk-g_w0szqs5EdwPOjA3P5G2vi_U38OTxug6X2qd8YL6GDVg4sz-sEePHLhn2bfh2Dx3YVtefn9k6G3q7xvhNL5c6r4Zd1jvEit-0vYTL-sP8_8ppKCbwgwHfyYQIE14Rgjq1FbSWZJ2EwLKRWnyko0KCJrVGyVSFWc2dBYyzQzZThBJC3wErrVrsIr8EKMVSzERJnI0N0zlTrSBKHQZllYylQPYHRa2sI0NONc7eKmcNeNsSxIGAULo2iEMYAP7R8_a4qNf_Tt89q2_ZplHcDwJL2iOYN7GoPVkUgyan7XNtPpYZeIqnB35D7sB2XCzOu_j_wWHs_W-bJYzleLV_CE51KH_w2he_h1xNcESQ76jduJd8Fm2k8 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Kinship+Measurement+on+Salient+Facial+Features&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Guodong+Guo&rft.au=Xiaolong+Wang&rft.date=2012-08-01&rft.pub=IEEE&rft.issn=0018-9456&rft.volume=61&rft.issue=8&rft.spage=2322&rft.epage=2325&rft_id=info:doi/10.1109%2FTIM.2012.2187468&rft.externalDocID=6157619 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon |