APA (7th ed.) Citation

Sun, C., Guan, M., Duan, K., Gao, S., & Chen, Z. (2025). A depression detection approach leveraging transfer learning with single-channel EEG. Journal of neural engineering, 22(3), 36001-36018. https://doi.org/10.1088/1741-2552/adcfc8

Chicago Style (17th ed.) Citation

Sun, Chengyuan, Mingjuan Guan, Keyu Duan, Shang Gao, and Zhao Chen. "A Depression Detection Approach Leveraging Transfer Learning with Single-channel EEG." Journal of Neural Engineering 22, no. 3 (2025): 36001-36018. https://doi.org/10.1088/1741-2552/adcfc8.

MLA (9th ed.) Citation

Sun, Chengyuan, et al. "A Depression Detection Approach Leveraging Transfer Learning with Single-channel EEG." Journal of Neural Engineering, vol. 22, no. 3, 2025, pp. 36001-36018, https://doi.org/10.1088/1741-2552/adcfc8.