Real-Time Scheduling of Single-Arm Cluster Tools Subject to Residency Time Constraints and Bounded Activity Time Variation
It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to...
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Published in | IEEE transactions on automation science and engineering Vol. 9; no. 3; pp. 564 - 577 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Piscataway, NJ
IEEE
01.07.2012
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. Note to Practitioners-This paper discusses the real-time scheduling problem of single-arm cluster tools with wafer residency time constraints and bounded activity time variation. With a Petri net model, schedulability is analyzed and schedulability conditions are presented by using analytical expressions. Then, an efficient algorithm is proposed to find a periodical schedule if it is schedulable. Such a schedule is optimal in terms of cycle time and can adapt to bounded activity time variation. Therefore, it is applicable to the scheduling and real-time control of cluster tools in semiconductor manufacturing plants. |
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AbstractList | It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. [PUBLICATION ABSTRACT] It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. Note to Practitioners-This paper discusses the real-time scheduling problem of single-arm cluster tools with wafer residency time constraints and bounded activity time variation. With a Petri net model, schedulability is analyzed and schedulability conditions are presented by using analytical expressions. Then, an efficient algorithm is proposed to find a periodical schedule if it is schedulable. Such a schedule is optimal in terms of cycle time and can adapt to bounded activity time variation. Therefore, it is applicable to the scheduling and real-time control of cluster tools in semiconductor manufacturing plants. |
Author | NaiQi Wu MengChu Zhou Yan Qiao |
Author_xml | – sequence: 1 givenname: Yan surname: Qiao fullname: Qiao, Yan – sequence: 2 givenname: NaiQi surname: Wu fullname: Wu, NaiQi – sequence: 3 givenname: MengChu surname: Zhou fullname: Zhou, MengChu |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26157223$$DView record in Pascal Francis |
BookMark | eNp9kc1r3DAQxUVIofn6A0ovgtKjNxrJkq3jdslHIRDIbnM1sjxOtXilVJIL6V8fO7vk0ENOMzC_9wbeOyXHPngk5AuwBQDTl5vl-mrBGfAFB83LSh2RE5CyLkRVi-N5L2UhtZSfyWlKW8Z4WWt2Qv49oBmKjdshXdvf2I2D80809HQ9zQGLZdzR1TCmjJFuQhgSXY_tFm2mOdAHTK5Db1_om8Eq-JSjcT4nanxHf4TRd9jRpc3ur8sH6tFEZ7IL_px86s2Q8OIwz8iv66vN6ra4u7_5uVreFVZwkQvJ2g5BK2tazbqyNzUoJeuuEtqWvUDONLSirQxTrSqnA5QajW5BM4OsteKMfNv7PsfwZ8SUm20Yo59eNjDFoLTmUE_U9wNlkjVDH423LjXP0e1MfGm4AllxLiYO9pyNIaWI_TsCrJmraOYqmrmK5lDFpKn-01iX3zKY4xo-VH7dKx0ivn9SoCteCvEKYHuYoA |
CODEN | ITASC7 |
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ContentType | Journal Article |
Copyright | 2015 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2012 |
Copyright_xml | – notice: 2015 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2012 |
DBID | 97E RIA RIE AAYXX CITATION IQODW 7SC 7SP 7TB 8FD FR3 JQ2 L7M L~C L~D |
DOI | 10.1109/TASE.2012.2192476 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library (IEL) CrossRef Pascal-Francis Computer and Information Systems Abstracts Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Engineering Research Database Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Applied Sciences |
EISSN | 1558-3783 |
EndPage | 577 |
ExternalDocumentID | 2709483501 26157223 10_1109_TASE_2012_2192476 6197243 |
Genre | orig-research Feature |
GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AGQYO AGSQL AHBIQ AIBXA AKJIK AKQYR ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IFIPE IPLJI JAVBF LAI M43 O9- OCL PQQKQ RIA RIE RNS AAYXX CITATION RIG IQODW 7SC 7SP 7TB 8FD FR3 JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c323t-50bde196cab90d4fa816658d739c4f3e2091b3b7a06b6458d149ea9b190ae0bc3 |
IEDL.DBID | RIE |
ISSN | 1545-5955 |
IngestDate | Sun Jun 29 15:15:51 EDT 2025 Mon Jul 21 09:14:42 EDT 2025 Thu Apr 24 22:57:03 EDT 2025 Tue Jul 01 02:56:27 EDT 2025 Tue Aug 26 16:59:15 EDT 2025 |
IsPeerReviewed | false |
IsScholarly | true |
Issue | 3 |
Keywords | Cluster tools Minimization Scheduling Real time Modeling Microelectronic fabrication Petri net (PN) Indirect method Off line semiconductor manufacturing Tool management Arm Petri net Discrete event system |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c323t-50bde196cab90d4fa816658d739c4f3e2091b3b7a06b6458d149ea9b190ae0bc3 |
Notes | SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 |
PQID | 1024699218 |
PQPubID | 27623 |
PageCount | 14 |
ParticipantIDs | crossref_primary_10_1109_TASE_2012_2192476 crossref_citationtrail_10_1109_TASE_2012_2192476 ieee_primary_6197243 proquest_journals_1024699218 pascalfrancis_primary_26157223 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2012-07-01 |
PublicationDateYYYYMMDD | 2012-07-01 |
PublicationDate_xml | – month: 07 year: 2012 text: 2012-07-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | Piscataway, NJ |
PublicationPlace_xml | – name: Piscataway, NJ – name: New York |
PublicationTitle | IEEE transactions on automation science and engineering |
PublicationTitleAbbrev | TASE |
PublicationYear | 2012 |
Publisher | IEEE Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref11 ref17 ref16 ref19 wu (ref21) 2012 ref45 ref48 ref47 ref42 ref41 ref44 (ref5) 1999 ref49 wu (ref24) 2009 ref7 ref9 ref4 ref3 ref6 tang (ref43) 2006; 11 li (ref10) 2009 ref35 ref34 ref37 ref36 ref31 ref30 ref33 ref2 ref1 ref39 ref38 wu (ref46) 2011; 33 qiao (ref40) 2007; 35 qiao (ref14) 2011 ref26 ref20 zhou (ref32) 1998 ref22 ref28 ref27 ref29 wu (ref23) 2008 wu (ref25) 2010; 7 wu (ref18) 1999; 29 lee (ref8) 2004 |
References_xml | – ident: ref20 doi: 10.1109/TASE.2010.2046736 – year: 2012 ident: ref21 article-title: Petri net modeling and cycle time analysis of dual-arm cluster tools with wafer revisiting publication-title: IEEE Trans Syst Man Cybern -Part A – ident: ref39 doi: 10.1109/TSMCC.2007.897321 – ident: ref26 doi: 10.1002/asjc.183 – ident: ref4 doi: 10.1109/TSM.2006.879414 – year: 1998 ident: ref32 publication-title: Modeling Simulation and Control of Flexible Manufacturing Systems Petri Net Approach – ident: ref45 doi: 10.1109/TASE.2007.905991 – ident: ref27 doi: 10.1109/TASE.2011.2178023 – ident: ref17 doi: 10.1109/66.641483 – ident: ref33 doi: 10.1109/66.705370 – ident: ref28 doi: 10.1109/TASE.2011.2160452 – ident: ref42 doi: 10.1109/TSM.2003.815205 – start-page: 109 year: 2008 ident: ref23 article-title: Petri net modeling and real-time control of dual-arm cluster tools with residency time constraint and activity time variations publication-title: Proc 4th IEEE Conf Autom Sci Eng – start-page: 1 year: 2004 ident: ref8 article-title: Workload balancing and scheduling of a single-armed cluster tool publication-title: Proc 5th APIEMS Conf – ident: ref7 doi: 10.1109/TASE.2007.912716 – ident: ref38 doi: 10.1109/TASE.2007.905995 – ident: ref6 doi: 10.1109/TSM.2003.815203 – ident: ref34 doi: 10.1109/70.964658 – ident: ref35 doi: 10.1109/41.334574 – ident: ref41 doi: 10.1109/MRA.2004.1275947 – year: 2011 ident: ref14 publication-title: Petri net modeling and wafer sojourn time analysis of single-arm cluster tools with residency time constraint and activity time variation – ident: ref13 doi: 10.1109/66.536110 – ident: ref16 doi: 10.1016/S0166-3615(01)00078-1 – ident: ref44 doi: 10.1109/TASE.2005.860989 – volume: 7 start-page: 303 year: 2010 ident: ref25 article-title: A closed-form solution for schedulability and optimal scheduling of dual-arm cluster tools with wafer residency time constraint based on steady schedule analysis publication-title: IEEE Trans Autom Sci Eng doi: 10.1109/TASE.2008.2008633 – year: 1999 ident: ref5 publication-title: Method and apparatus for priority based scheduling of wafer processing within a multiple chamber semiconductor wafer processing tool – ident: ref37 doi: 10.1109/TSMCA.2011.2164241 – ident: ref47 doi: 10.1109/66.705373 – ident: ref2 doi: 10.1109/TASE.2010.2046891 – ident: ref22 doi: 10.1109/70.964666 – year: 2009 ident: ref24 publication-title: System Modeling and Control with Resource-Oriented Petri Nets – ident: ref15 doi: 10.1109/70.964662 – ident: ref9 doi: 10.1109/TASE.2005.851236 – volume: 35 start-page: 537 year: 2007 ident: ref40 article-title: Performance evaluation system for scheduling semiconductor wafer product line publication-title: Journal of Tongji University – ident: ref11 doi: 10.1109/TSM.2003.810936 – ident: ref36 doi: 10.1109/TSMCA.2011.2162502 – year: 2009 ident: ref10 publication-title: Deadlock Resolution in Automated Manufacturing Systems A Novel Petri Net Approach – ident: ref12 doi: 10.1109/66.311340 – volume: 33 start-page: 9 year: 2011 ident: ref46 article-title: Intelligent token Petri nets for modeling and control of reconfigurable automated manufacturing systems with dynamical changes publication-title: Trans Inst Meas Control doi: 10.1177/0142331208095622 – ident: ref30 doi: 10.1109/TSM.2005.852103 – ident: ref1 doi: 10.1016/j.dam.2008.03.021 – ident: ref3 doi: 10.1287/msom.4.4.296.5731 – ident: ref48 doi: 10.1109/TSMCA.2011.2147305 – volume: 29 start-page: 192 year: 1999 ident: ref18 article-title: Necessary and sufficient conditions for deadlock-free operation in flexible manufacturing systems using a colored Petri net model publication-title: IEEE Trans Syst Man Cybern Part C doi: 10.1109/5326.760564 – ident: ref19 doi: 10.1109/TSM.2008.2000425 – ident: ref49 doi: 10.1109/TSMCA.2011.2159587 – ident: ref29 doi: 10.1109/TASE.2007.906678 – ident: ref31 doi: 10.1007/978-1-4615-3126-5 – volume: 11 start-page: 105 year: 2006 ident: ref43 article-title: A queueing network-based method for reconfiguration of back-end semiconductor manufacturing systems with unreliable equipment publication-title: Int J Intell Control Syst |
SSID | ssj0024890 |
Score | 2.2864778 |
Snippet | It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model... |
SourceID | proquest pascalfrancis crossref ieee |
SourceType | Aggregation Database Index Database Enrichment Source Publisher |
StartPage | 564 |
SubjectTerms | Algorithms Applied sciences Automation Cluster tools Computer science; control theory; systems Control system analysis Control theory. Systems discrete event system Discrete event systems Electronics Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Petri net (PN) Petri nets Real time Real-time systems Robots Scheduling Semiconductor device manufacture Semiconductor device modeling Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices semiconductor manufacturing |
Title | Real-Time Scheduling of Single-Arm Cluster Tools Subject to Residency Time Constraints and Bounded Activity Time Variation |
URI | https://ieeexplore.ieee.org/document/6197243 https://www.proquest.com/docview/1024699218 |
Volume | 9 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB4Bp_ZQoFB1ecmHnqp6SeIkGx8XBEKV4MAuiFvkx4QDqw1qsofy65lxsgu0FeopkeLYcWZsfzMezwfwLasK7UkVpHMOZWrjnMacUpKgfsG7OsZY9ndcXuUXN-nPu-xuDX6szsIgYgg-wyHfhr18X7sFu8qOc-bIStU6rJPh1p3VesmrVwR_CiMCmeks63cw40gfT8eTMw7iSoYJmxucXuTVGhRIVTgk0jT0V6qOzuKvmTksN-ebcLn80C7K5GG4aO3QPf2Rw_F_e7IFn3rcKcadomzDGs4_w8dX2Qh34OmaQKPkMyFiQqL0HKN-L-pKTOg6Q0k6IU5nC86sIKZ1PWsEzTrsxhFtLa6xCfSkv0WogHlAA_tE2wgz9-KE2ZvQi7Hr2Cq6UrdkqAfN2IWb87Pp6YXsqRmkU4lqZRZZjzR4nbE68mllePsxK_xIaZdWChOCIVbZkYlym6f0gAwxNNoS_DAYWae-wMa8nuNXEIkmzOLjwsQVZ8IpLOakViG21TiD8QCipbBK1-ct5w7MymC_RLpk-ZYs37KX7wC-r1557JJ2vFd4h-WzKtiLZgBHbzRi9ZxMzmxEoGoAB0sVKftx31ArSZprTbhp79_V7sMHbrwL-D2AjfbXAg8J1rT2KOjzM5hc88A |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT9wwEB1ROLQcCi2tupRSH3qq6iWJ42x8XBBoaVkO7FJxi_yVHrraoCZ7KL-eGSe7QIsQp0SK49iZsf1mPJ4H8EWWuXKoCtxa63lq4gzHnBAcoX5OuzpaG_J3jM-z0WX6_UpercG31VkY730IPvN9ug17-a6yC3KVHWTEkZWKF7CB676M29Nad5n18uBRIUzApZKy28OMI3UwHU6OKYwr6SdkcFCCkXurUKBVoaBIXeN_KVtCi__m5rDgnGzBeNnUNs7kd3_RmL69-SeL43P7sg2vO-TJhq2qvIE1P38Lm_fyEe7AzQXCRk6nQtgEhekoSv0Xq0o2wevMc9QKdjRbUG4FNq2qWc1w3iFHDmsqduHrQFD6l4UKiAk08E80NdNzxw6Jv8k7NrQtX0Vb6iea6kE33sHlyfH0aMQ7cgZuRSIaLiPjPA5fq42KXFpq2oCUuRsIZdNS-ASBiBFmoKPMZCk-QFPMa2UQgGgfGSvew_q8mvsPwBKFqMXFuY5LyoWTG5-hYoXoVm21j3sQLYVV2C5zOXVgVgQLJlIFybcg-RadfHvwdfXKdZu246nCOySfVcFOND3Yf6ARq-dodMoBwqoe7C1VpOhGfo1fSdJMKUROu49X-xlejqbjs-Ls9PzHR3hFDWnDf_dgvfmz8J8Q5DRmP-j2LXIT9wk |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Real-Time+Scheduling+of+Single-Arm+Cluster+Tools+Subject+to+Residency+Time+Constraints+and+Bounded+Activity+Time+Variation&rft.jtitle=IEEE+transactions+on+automation+science+and+engineering&rft.au=Yan+Qiao&rft.au=NaiQi+Wu&rft.au=MengChu+Zhou&rft.date=2012-07-01&rft.pub=IEEE&rft.issn=1545-5955&rft.volume=9&rft.issue=3&rft.spage=564&rft.epage=577&rft_id=info:doi/10.1109%2FTASE.2012.2192476&rft.externalDocID=6197243 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1545-5955&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1545-5955&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1545-5955&client=summon |