Real-Time Scheduling of Single-Arm Cluster Tools Subject to Residency Time Constraints and Bounded Activity Time Variation

It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to...

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Published inIEEE transactions on automation science and engineering Vol. 9; no. 3; pp. 564 - 577
Main Authors Qiao, Yan, Wu, NaiQi, Zhou, MengChu
Format Journal Article
LanguageEnglish
Published Piscataway, NJ IEEE 01.07.2012
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. Note to Practitioners-This paper discusses the real-time scheduling problem of single-arm cluster tools with wafer residency time constraints and bounded activity time variation. With a Petri net model, schedulability is analyzed and schedulability conditions are presented by using analytical expressions. Then, an efficient algorithm is proposed to find a periodical schedule if it is schedulable. Such a schedule is optimal in terms of cycle time and can adapt to bounded activity time variation. Therefore, it is applicable to the scheduling and real-time control of cluster tools in semiconductor manufacturing plants.
AbstractList It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. [PUBLICATION ABSTRACT]
It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model to describe the system and proposes a two-level real-time scheduling architecture. At the lower level, a real-time control policy is used to offset the activity time variation as much as possible. At the upper level, a periodical off-line schedule is derived under the normal condition. This work presents the schedulability conditions and scheduling algorithms for an off-line schedule. The schedulability conditions can be analytically checked. If they are satisfied, an off-line schedule can be analytically found. The off-line schedule together with a real-time control policy forms the real-time schedule for the system. It is optimal in terms of cycle time minimization. Illustrative examples are given to show the application of the proposed approach. Note to Practitioners-This paper discusses the real-time scheduling problem of single-arm cluster tools with wafer residency time constraints and bounded activity time variation. With a Petri net model, schedulability is analyzed and schedulability conditions are presented by using analytical expressions. Then, an efficient algorithm is proposed to find a periodical schedule if it is schedulable. Such a schedule is optimal in terms of cycle time and can adapt to bounded activity time variation. Therefore, it is applicable to the scheduling and real-time control of cluster tools in semiconductor manufacturing plants.
Author NaiQi Wu
MengChu Zhou
Yan Qiao
Author_xml – sequence: 1
  givenname: Yan
  surname: Qiao
  fullname: Qiao, Yan
– sequence: 2
  givenname: NaiQi
  surname: Wu
  fullname: Wu, NaiQi
– sequence: 3
  givenname: MengChu
  surname: Zhou
  fullname: Zhou, MengChu
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26157223$$DView record in Pascal Francis
BookMark eNp9kc1r3DAQxUVIofn6A0ovgtKjNxrJkq3jdslHIRDIbnM1sjxOtXilVJIL6V8fO7vk0ENOMzC_9wbeOyXHPngk5AuwBQDTl5vl-mrBGfAFB83LSh2RE5CyLkRVi-N5L2UhtZSfyWlKW8Z4WWt2Qv49oBmKjdshXdvf2I2D80809HQ9zQGLZdzR1TCmjJFuQhgSXY_tFm2mOdAHTK5Db1_om8Eq-JSjcT4nanxHf4TRd9jRpc3ur8sH6tFEZ7IL_px86s2Q8OIwz8iv66vN6ra4u7_5uVreFVZwkQvJ2g5BK2tazbqyNzUoJeuuEtqWvUDONLSirQxTrSqnA5QajW5BM4OsteKMfNv7PsfwZ8SUm20Yo59eNjDFoLTmUE_U9wNlkjVDH423LjXP0e1MfGm4AllxLiYO9pyNIaWI_TsCrJmraOYqmrmK5lDFpKn-01iX3zKY4xo-VH7dKx0ivn9SoCteCvEKYHuYoA
CODEN ITASC7
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ContentType Journal Article
Copyright 2015 INIST-CNRS
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2012
Copyright_xml – notice: 2015 INIST-CNRS
– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2012
DBID 97E
RIA
RIE
AAYXX
CITATION
IQODW
7SC
7SP
7TB
8FD
FR3
JQ2
L7M
L~C
L~D
DOI 10.1109/TASE.2012.2192476
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE Electronic Library (IEL)
CrossRef
Pascal-Francis
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Mechanical & Transportation Engineering Abstracts
Technology Research Database
Engineering Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Mechanical & Transportation Engineering Abstracts
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Engineering Research Database
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList Technology Research Database

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Applied Sciences
EISSN 1558-3783
EndPage 577
ExternalDocumentID 2709483501
26157223
10_1109_TASE_2012_2192476
6197243
Genre orig-research
Feature
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AIBXA
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
PQQKQ
RIA
RIE
RNS
AAYXX
CITATION
RIG
IQODW
7SC
7SP
7TB
8FD
FR3
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c323t-50bde196cab90d4fa816658d739c4f3e2091b3b7a06b6458d149ea9b190ae0bc3
IEDL.DBID RIE
ISSN 1545-5955
IngestDate Sun Jun 29 15:15:51 EDT 2025
Mon Jul 21 09:14:42 EDT 2025
Thu Apr 24 22:57:03 EDT 2025
Tue Jul 01 02:56:27 EDT 2025
Tue Aug 26 16:59:15 EDT 2025
IsPeerReviewed false
IsScholarly true
Issue 3
Keywords Cluster tools
Minimization
Scheduling
Real time
Modeling
Microelectronic fabrication
Petri net (PN)
Indirect method
Off line
semiconductor manufacturing
Tool management
Arm
Petri net
Discrete event system
Language English
License CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c323t-50bde196cab90d4fa816658d739c4f3e2091b3b7a06b6458d149ea9b190ae0bc3
Notes SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
PQID 1024699218
PQPubID 27623
PageCount 14
ParticipantIDs crossref_primary_10_1109_TASE_2012_2192476
crossref_citationtrail_10_1109_TASE_2012_2192476
ieee_primary_6197243
proquest_journals_1024699218
pascalfrancis_primary_26157223
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2012-07-01
PublicationDateYYYYMMDD 2012-07-01
PublicationDate_xml – month: 07
  year: 2012
  text: 2012-07-01
  day: 01
PublicationDecade 2010
PublicationPlace Piscataway, NJ
PublicationPlace_xml – name: Piscataway, NJ
– name: New York
PublicationTitle IEEE transactions on automation science and engineering
PublicationTitleAbbrev TASE
PublicationYear 2012
Publisher IEEE
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0024890
Score 2.2864778
Snippet It is very challenging to schedule cluster tools subject to wafer residency time constraints and activity time variation. This work develops a Petri net model...
SourceID proquest
pascalfrancis
crossref
ieee
SourceType Aggregation Database
Index Database
Enrichment Source
Publisher
StartPage 564
SubjectTerms Algorithms
Applied sciences
Automation
Cluster tools
Computer science; control theory; systems
Control system analysis
Control theory. Systems
discrete event system
Discrete event systems
Electronics
Exact sciences and technology
Microelectronic fabrication (materials and surfaces technology)
Petri net (PN)
Petri nets
Real time
Real-time systems
Robots
Scheduling
Semiconductor device manufacture
Semiconductor device modeling
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
semiconductor manufacturing
Title Real-Time Scheduling of Single-Arm Cluster Tools Subject to Residency Time Constraints and Bounded Activity Time Variation
URI https://ieeexplore.ieee.org/document/6197243
https://www.proquest.com/docview/1024699218
Volume 9
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT9wwEB4Bp_ZQoFB1ecmHnqp6SeIkGx8XBEKV4MAuiFvkx4QDqw1qsofy65lxsgu0FeopkeLYcWZsfzMezwfwLasK7UkVpHMOZWrjnMacUpKgfsG7OsZY9ndcXuUXN-nPu-xuDX6szsIgYgg-wyHfhr18X7sFu8qOc-bIStU6rJPh1p3VesmrVwR_CiMCmeks63cw40gfT8eTMw7iSoYJmxucXuTVGhRIVTgk0jT0V6qOzuKvmTksN-ebcLn80C7K5GG4aO3QPf2Rw_F_e7IFn3rcKcadomzDGs4_w8dX2Qh34OmaQKPkMyFiQqL0HKN-L-pKTOg6Q0k6IU5nC86sIKZ1PWsEzTrsxhFtLa6xCfSkv0WogHlAA_tE2wgz9-KE2ZvQi7Hr2Cq6UrdkqAfN2IWb87Pp6YXsqRmkU4lqZRZZjzR4nbE68mllePsxK_xIaZdWChOCIVbZkYlym6f0gAwxNNoS_DAYWae-wMa8nuNXEIkmzOLjwsQVZ8IpLOakViG21TiD8QCipbBK1-ct5w7MymC_RLpk-ZYs37KX7wC-r1557JJ2vFd4h-WzKtiLZgBHbzRi9ZxMzmxEoGoAB0sVKftx31ArSZprTbhp79_V7sMHbrwL-D2AjfbXAg8J1rT2KOjzM5hc88A
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT9wwEB1ROLQcCi2tupRSH3qq6iWJ42x8XBBoaVkO7FJxi_yVHrraoCZ7KL-eGSe7QIsQp0SK49iZsf1mPJ4H8EWWuXKoCtxa63lq4gzHnBAcoX5OuzpaG_J3jM-z0WX6_UpercG31VkY730IPvN9ug17-a6yC3KVHWTEkZWKF7CB676M29Nad5n18uBRIUzApZKy28OMI3UwHU6OKYwr6SdkcFCCkXurUKBVoaBIXeN_KVtCi__m5rDgnGzBeNnUNs7kd3_RmL69-SeL43P7sg2vO-TJhq2qvIE1P38Lm_fyEe7AzQXCRk6nQtgEhekoSv0Xq0o2wevMc9QKdjRbUG4FNq2qWc1w3iFHDmsqduHrQFD6l4UKiAk08E80NdNzxw6Jv8k7NrQtX0Vb6iea6kE33sHlyfH0aMQ7cgZuRSIaLiPjPA5fq42KXFpq2oCUuRsIZdNS-ASBiBFmoKPMZCk-QFPMa2UQgGgfGSvew_q8mvsPwBKFqMXFuY5LyoWTG5-hYoXoVm21j3sQLYVV2C5zOXVgVgQLJlIFybcg-RadfHvwdfXKdZu246nCOySfVcFOND3Yf6ARq-dodMoBwqoe7C1VpOhGfo1fSdJMKUROu49X-xlejqbjs-Ls9PzHR3hFDWnDf_dgvfmz8J8Q5DRmP-j2LXIT9wk
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Real-Time+Scheduling+of+Single-Arm+Cluster+Tools+Subject+to+Residency+Time+Constraints+and+Bounded+Activity+Time+Variation&rft.jtitle=IEEE+transactions+on+automation+science+and+engineering&rft.au=Yan+Qiao&rft.au=NaiQi+Wu&rft.au=MengChu+Zhou&rft.date=2012-07-01&rft.pub=IEEE&rft.issn=1545-5955&rft.volume=9&rft.issue=3&rft.spage=564&rft.epage=577&rft_id=info:doi/10.1109%2FTASE.2012.2192476&rft.externalDocID=6197243
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1545-5955&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1545-5955&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1545-5955&client=summon