Two-Dimensional Markov Chain Analysis of Radiation-Induced Soft Errors in Subthreshold Nanoscale CMOS Devices - Jannaty, P; Sabou, F C; Gadlage, M; Bahar, R I; Mundy, J; Patterson, W; Reed, R A; Weller, R A; Schrimpf, R D; Zaslavsky, A (IEEE transactions on nuclear science, 2010)
Keywords: Alpha particles; Alpha-particle radiation effects; Channels; CMOS devices; CMOS integrated circuits; Error analysis; Flip-flops; Logic; Logic devices; Markov chains; Markov processes; Mathematical analysis; Nanostructure; Operating temperature; Radiation effects; radiation effects in devices; reliability; Single event upset; Soft errors; SRAM chips; SRAMs