APA (7th ed.) Citation

Jannaty, P., Sabou, F. C., Gadlage, M., Bahar, R. I., Mundy, J., Patterson, W., . . . Zaslavsky, A. (2010). Two-Dimensional Markov Chain Analysis of Radiation-Induced Soft Errors in Subthreshold Nanoscale CMOS Devices. IEEE transactions on nuclear science, 57(6), 3768-3774. https://doi.org/10.1109/TNS.2010.2068561

Chicago Style (17th ed.) Citation

Jannaty, P., et al. "Two-Dimensional Markov Chain Analysis of Radiation-Induced Soft Errors in Subthreshold Nanoscale CMOS Devices." IEEE Transactions on Nuclear Science 57, no. 6 (2010): 3768-3774. https://doi.org/10.1109/TNS.2010.2068561.

MLA (9th ed.) Citation

Jannaty, P., et al. "Two-Dimensional Markov Chain Analysis of Radiation-Induced Soft Errors in Subthreshold Nanoscale CMOS Devices." IEEE Transactions on Nuclear Science, vol. 57, no. 6, 2010, pp. 3768-3774, https://doi.org/10.1109/TNS.2010.2068561.