Inference From Lumen Degradation Data Under Wiener Diffusion Process

• Published in: IEEE transactions on reliability Vol. 61; no. 3; pp. 710 - 718
• Main Authors: Tsai, Tzong-Ru, Lin, Chin-Wei, Sung, Yi-Ling, Chou, Pei-Ting, Chen, Chiu-Ling, Lio, Yuhlong
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.09.2012; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Approximation; Arrhenius law model; Cumulative damage; Degradation; Diffusion; draft parameter; exponential law model; Inequalities; Light emitting diodes; Load modeling; Loading; Lumens; Maximum likelihood estimation; power law model; Reliability; step-stress loading method; Stress; Stresses
• ISSN: 0018-9529; 1558-1721
• DOI: 10.1109/TR.2012.2207533

The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parame...