On a new stochastic model for cascading failures

• Published in: Journal of applied probability Vol. 57; no. 4; pp. 1150 - 1161
• Main Author: Lee, Hyunju
• Format: Journal Article
• Language: English
• Published: Cambridge, UK Cambridge University Press 01.12.2020; Applied Probability Trust
• Subjects: Accelerated life tests; Accelerated tests; Age; Failure; Failure analysis; Lifetime; Model testing; Random variables; Research Papers; Stochastic models; Stress; k-out-of-n system; 62P30; stochastic intensity; accelerated life test model; Cascading failure; usual stochastic order; 60K10

In this paper, to model cascading failures, a new stochastic failure model is proposed. In a system subject to cascading failures, after each failure of the component, the remaining component suffers from increased load or stress. This results in shortened residual lifetimes of the remaining compone...