Noise Optimization for MKIDs With Different Design Geometries and Material Selections

The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millim...

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Published inIEEE transactions on applied superconductivity Vol. 33; no. 5; pp. 1 - 8
Main Authors Pan, Z., Dibert, K. R., Zhang, J., Barry, P. S., Anderson, A. J., Bender, A. N., Benson, B. A., Cecil, T., Chang, C. L., Gualtieri, R., Li, J., Lisovenko, M., Novosad, V., Rouble, M., Wang, G., Yefremenko, V.
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LanguageEnglish
Published New York IEEE 01.08.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Abstract The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millimeter-wavelength experiments. We extract the contributions from two-level system noise in the dielectric layer, the generation-recombination noise intrinsic to the superconducting thin-film, and system white noise from each detector noise power spectrum and characterize how these noise components depend on detector geometry, material, and measurement conditions such as driving power and temperature. We observe a reduction in the amplitude of two-level system noise with both an elevated sample temperature and an increased gap between the fingers within the interdigitated capacitors for both aluminum and niobium detectors. We also verify the expected reduction of the generation-recombination noise and associated quasiparticle lifetime with reduced inductor volume. This study also iterates over different materials, including aluminum, niobium, and aluminum manganese, and compares the results with an underlying physical model.
AbstractList The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. Here, we analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millimeter-wavelength experiments. We extract the contributions from two-level system noise in the dielectric layer, the generation-recombination noise intrinsic to the superconducting thin-film, and system white noise from each detector noise power spectrum and characterize how these noise components depend on detector geometry, material, and measurement conditions such as driving power and temperature. We observe a reduction in the amplitude of two-level system noise with both an elevated sample temperature and an increased gap between the fingers within the interdigitated capacitors for both aluminum and niobium detectors. We also verify the expected reduction of the generation-recombination noise and associated quasiparticle lifetime with reduced inductor volume. This study also iterates over different materials, including aluminum, niobium, and aluminum manganese, and compares the results with an underlying physical model.
The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several changes to the lumped-element inductor and interdigitated capacitor geometry on the noise performance of a series of MKIDs intended for millimeter-wavelength experiments. We extract the contributions from two-level system noise in the dielectric layer, the generation-recombination noise intrinsic to the superconducting thin-film, and system white noise from each detector noise power spectrum and characterize how these noise components depend on detector geometry, material, and measurement conditions such as driving power and temperature. We observe a reduction in the amplitude of two-level system noise with both an elevated sample temperature and an increased gap between the fingers within the interdigitated capacitors for both aluminum and niobium detectors. We also verify the expected reduction of the generation-recombination noise and associated quasiparticle lifetime with reduced inductor volume. This study also iterates over different materials, including aluminum, niobium, and aluminum manganese, and compares the results with an underlying physical model.
Author Chang, C. L.
Cecil, T.
Wang, G.
Yefremenko, V.
Dibert, K. R.
Lisovenko, M.
Benson, B. A.
Novosad, V.
Barry, P. S.
Anderson, A. J.
Rouble, M.
Bender, A. N.
Li, J.
Gualtieri, R.
Pan, Z.
Zhang, J.
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Snippet The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. We analyze the effect of several...
The separation and optimization of noise components is critical to microwave-kinetic inductance detector (MKID) development. Here, we analyze the effect of...
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SubjectTerms Aluminum
Capacitors
Design optimization
Detectors
Driving conditions
Elementary excitations
Generation-recombination noise
Geometry
Inductance
Inductors
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Manganese
microwave kinetic inductance detectors (MKIDs)
Niobium
noise
Noise generation
Optical resonators
optimization
Sensors
Temperature measurement
Thin films
two-level system (TLS)
White noise
Title Noise Optimization for MKIDs With Different Design Geometries and Material Selections
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