Structural characterization of polycrystalline thin films by X-ray diffraction techniques - Pandey, Akhilesh; Dalal, Sandeep; Dutta, Shankar; Dixit, Ambesh (Journal of materials science. Materials in electronics, 2021)
Keywords: Characterization and Evaluation of Materials; Chemistry and Materials Science; Crystal defects; Crystal structure; Crystallinity; Crystallites; Degree of crystallinity; Depth profiling; Materials Science; Multilayers; Multiphase; Nondestructive testing; Optical and Electronic Materials; Parameters; Polycrystals; Preferred orientation; Review; Structural analysis; Texture; Thin films; X ray powder diffraction; X-ray diffraction