APA (7th ed.) Citation

Pandey, A., Dalal, S., Dutta, S., & Dixit, A. (2021). Structural characterization of polycrystalline thin films by X-ray diffraction techniques. Journal of materials science. Materials in electronics, 32(2), 1341-1368. https://doi.org/10.1007/s10854-020-04998-w

Chicago Style (17th ed.) Citation

Pandey, Akhilesh, Sandeep Dalal, Shankar Dutta, and Ambesh Dixit. "Structural Characterization of Polycrystalline Thin Films by X-ray Diffraction Techniques." Journal of Materials Science. Materials in Electronics 32, no. 2 (2021): 1341-1368. https://doi.org/10.1007/s10854-020-04998-w.

MLA (9th ed.) Citation

Pandey, Akhilesh, et al. "Structural Characterization of Polycrystalline Thin Films by X-ray Diffraction Techniques." Journal of Materials Science. Materials in Electronics, vol. 32, no. 2, 2021, pp. 1341-1368, https://doi.org/10.1007/s10854-020-04998-w.