Optical properties and morphology analysis of hexagonal WO3 thin films obtained by electron beam evaporation - Shakoury, Reza; Arman, Ali; Rezaee, Sahar; Korpi, Alireza Grayeli; Kulesza, Sławomir; Luna, Carlos; Bramowicz, Mirosław; Mardani, Mohsen (Journal of materials science. Materials in electronics, 2021)
Keywords: Atomic force microscopy; Characterization and Evaluation of Materials; Chemistry and Materials Science; Crystal structure; Crystallinity; Electron beams; Evaporation; Film thickness; Glass substrates; Grain size; Homogeneous structure; Materials Science; Microscopes; Morphology; Optical and Electronic Materials; Optical properties; Refractivity; Room temperature; Surface roughness; Thin films; Tungsten oxides