Electrical and structural properties of heterojunction AZO, NZO and NiO thin films

• Published in: Applied physics. A, Materials science & processing Vol. 129; no. 5
• Main Authors: Dejam, Laya, Ghaderi, Atefeh, Solaymani, Shahram, Sabbaghzadeh, Jamshid, Țălu, Ștefan, Salehi Shayegan, Amir Hossein
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer Berlin Heidelberg 01.05.2023; Springer Nature B.V
• Subjects: Applied physics; Characterization and Evaluation of Materials; Condensed Matter Physics; Electronic devices; Energy gap; Heterojunctions; Machines; Manufacturing; Materials science; Metal oxides; Nanoparticles; Nanotechnology; Nickel oxides; Optical and Electronic Materials; Performance evaluation; Physics; Physics and Astronomy; Processes; Silicon substrates; Surfaces and Interfaces; Thin Films; Zinc oxide; Metal oxide; NZO; NiO; AZO; Heterojunction

Semiconducting metal oxide thin films of ZnO and NiO with different impurity of n-type and p-type conductivity were grown on a Si substrate by magnetic sputtering method. The structural characteristics, i.e. crystalline characteristics and crystalline order or amorphousness of layers, were investiga...