APA (7th ed.) Citation

Smagoń, K., Stach, S., Ţălu, Ş., Arman, A., Achour, A., Luna, C., . . . Grayeli Korpi, A. (2017). Studies of the micromorphology of sputtered TiN thin films by autocorrelation techniques. European physical journal plus, 132(12), 520. https://doi.org/10.1140/epjp/i2017-11801-5

Chicago Style (17th ed.) Citation

Smagoń, Kamil, et al. "Studies of the Micromorphology of Sputtered TiN Thin Films by Autocorrelation Techniques." European Physical Journal Plus 132, no. 12 (2017): 520. https://doi.org/10.1140/epjp/i2017-11801-5.

MLA (9th ed.) Citation

Smagoń, Kamil, et al. "Studies of the Micromorphology of Sputtered TiN Thin Films by Autocorrelation Techniques." European Physical Journal Plus, vol. 132, no. 12, 2017, p. 520, https://doi.org/10.1140/epjp/i2017-11801-5.