Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted - Shakoury, Reza; Arman, Ali; Ţălu, Ştefan; Dastan, Davoud; Luna, Carlos; Rezaee, Sahar (Optical and quantum electronics, 2020)
Keywords: Atomic force microscopy; Characterization and Evaluation of Materials; Computer Communication Networks; Deposition; Electrical Engineering; Electron beams; Energy; Energy gap; Grain size; Ion beams; Lasers; Optical Devices; Optical properties; Optics; Optoelectronic devices; Photonics; Physics; Physics and Astronomy; Spectrum analysis; Surface layers; Surface tension; Thin films; Titanium dioxide; AFM; TiO; 3-D surface microtexture; Stereometric analysis; Optical properties; thin films