APA (7th ed.) Citation

Shakoury, R., Arman, A., Ţălu, Ş., Dastan, D., Luna, C., & Rezaee, S. (2020). Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted. Optical and quantum electronics, 52(5), . https://doi.org/10.1007/s11082-020-02388-4

Chicago Style (17th ed.) Citation

Shakoury, Reza, Ali Arman, Ştefan Ţălu, Davoud Dastan, Carlos Luna, and Sahar Rezaee. "Stereometric Analysis of TiO2 Thin Films Deposited by Electron Beam Ion Assisted." Optical and Quantum Electronics 52, no. 5 (2020). https://doi.org/10.1007/s11082-020-02388-4.

MLA (9th ed.) Citation

Shakoury, Reza, et al. "Stereometric Analysis of TiO2 Thin Films Deposited by Electron Beam Ion Assisted." Optical and Quantum Electronics, vol. 52, no. 5, 2020, https://doi.org/10.1007/s11082-020-02388-4.