Structural characteristics and application of Cu oblique nano-rod thin films for surface-enhanced Raman spectroscopy (SERS)

• Published in: Applied physics. A, Materials science & processing Vol. 127; no. 9
• Main Authors: Babaei, Reza, Savaloni, Hadi
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer Berlin Heidelberg 01.09.2021; Springer Nature B.V
• Subjects: Applied physics; Atomic force microscopes; Atomic force microscopy; Characterization and Evaluation of Materials; Condensed Matter Physics; Copper; Crystallography; Deposition; Electric fields; Field emission microscopy; Gold; Grain size; Machines; Manufacturing; Materials science; Morphology; Nanorods; Nanotechnology; Optical and Electronic Materials; Physics; Physics and Astronomy; Processes; Raman spectroscopy; Silver; Spectrum analysis; Surface roughness; Surfaces and Interfaces; Thin Films; Oblique angle deposition; 4,4’-Bipyridine; Porosity; Cu nano-rods; Surface-enhanced Raman spectroscopy

In this work, oblique angle deposition technique is used to fabricate Cu nano-rods with different growth angles on two types of substrates (Cu and (Ti sputtered)/Si). Field emission electron microscope and atomic force microscope as well as X-ray diffraction were used to characterize the structure,...