Strain engineering of vertical molybdenum ditelluride phase-change memristors - Hou, Wenhui; Azizimanesh, Ahmad; Dey, Aditya; Yang, Yufeng; Wang, Wuxiucheng; Shao, Chen; Wu, Hui; Askari, Hesam; Singh, Sobhit; Wu, Stephen M (Nature electronics, 2024)
Keywords: Contact stresses; Electric contacts; Electric fields; Engineering; Film thickness; Memristors; Metal films; Molybdenum; Molybdenum compounds; Multilayers; Phase change; Phase transitions; Process parameters; Ratios; Self alignment; Strain; Tellurides; Thin films; Transistors; Two dimensional materials