Semi-supervised feature extraction for EEG classification
Two semi-supervised feature extraction methods are proposed for electroencephalogram (EEG) classification. They aim to alleviate two important limitations in brain–computer interfaces (BCIs). One is on the requirement of small training sets owing to the need of short calibration sessions. The second...
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Published in | Pattern analysis and applications : PAA Vol. 16; no. 2; pp. 213 - 222 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
London
Springer-Verlag
01.05.2013
Springer |
Subjects | |
Online Access | Get full text |
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