Semi-supervised feature extraction for EEG classification

Two semi-supervised feature extraction methods are proposed for electroencephalogram (EEG) classification. They aim to alleviate two important limitations in brain–computer interfaces (BCIs). One is on the requirement of small training sets owing to the need of short calibration sessions. The second...

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Bibliographic Details
Published inPattern analysis and applications : PAA Vol. 16; no. 2; pp. 213 - 222
Main Authors Tu, Wenting, Sun, Shiliang
Format Journal Article
LanguageEnglish
Published London Springer-Verlag 01.05.2013
Springer
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