Combined invariants to blur and rotation using Zernike moment descriptors - Zhu, Hongqing; Liu, Min; Ji, Hanjie; Li, Yu (Pattern analysis and applications : PAA, 2010)
Keywords: Applied sciences; Artificial intelligence; Computer Science; Computer science; control theory; systems; Exact sciences and technology; Pattern Recognition; Pattern recognition. Digital image processing. Computational geometry; Theoretical Advances; Zernike moments; Rotation invariants; Radial moments; Pattern recognition; Blur invariants; Classification; Computer vision; Image processing; Redundancy; Object recognition; Blurred image; Zernike polynomial; Legendre polynomial; Noisy image; Moment invariant; Robustness