APA (7th ed.) Citation

Shakoury, R., Rezaee, S., Mwema, F., Luna, C., Ghosh, K., Jurečka, S., . . . Grayeli Korpi, A. (2020). Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method. Optical and quantum electronics, 52(2), . https://doi.org/10.1007/s11082-019-2173-5

Chicago Style (17th ed.) Citation

Shakoury, Reza, Sahar Rezaee, Fredrick Mwema, Carlos Luna, Koushik Ghosh, Stanislav Jurečka, Ştefan Ţălu, Ali Arman, and Alireza Grayeli Korpi. "Multifractal and Optical Bandgap Characterization of Ta2O5 Thin Films Deposited by Electron Gun Method." Optical and Quantum Electronics 52, no. 2 (2020). https://doi.org/10.1007/s11082-019-2173-5.

MLA (9th ed.) Citation

Shakoury, Reza, et al. "Multifractal and Optical Bandgap Characterization of Ta2O5 Thin Films Deposited by Electron Gun Method." Optical and Quantum Electronics, vol. 52, no. 2, 2020, https://doi.org/10.1007/s11082-019-2173-5.