A correction method of color projection fringes in 3D contour measurement

In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this...

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Bibliographic Details
Published inOptoelectronics letters Vol. 11; no. 4; pp. 303 - 306
Main Author 宋丽梅 李宗艳 陈昌曼 习江涛 郭庆华 李晓捷
Format Journal Article
LanguageEnglish
Published Tianjin Tianjin University of Technology 01.07.2015
Subjects
Lasers
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
三维轮廓测量
光栅条纹
彩色
投影条纹
条纹投影
校正方法
测量速度
非线性误差
Measurement Speed
Unwrap Phase
Interference Phenomenon
Nonlinear Error
Blue Channel
Online AccessGet full text
ISSN1673-1905
1993-5013
DOI10.1007/s11801-015-5050-x

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Summary:In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction.
Bibliography:SONG Li-mei, LI Zong-yan, CHEN Chang-man , XI Jiang-tao , GUO Qing-hua, LI Xiao-jie （ 1. Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tian- fin 300387, China 2. Department of Electricity Examination, Patent Examination Cooperation Tianjin Center of the Patent Office, State Intellectual Property Office, Tianjin 300304, China 3. School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville 2500, Australia）
12-1370/TN
correction contour projection grating correcting projected pixel sinusoidal fringe Tianjin
In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction.
ISSN:1673-1905
1993-5013
DOI:10.1007/s11801-015-5050-x