A correction method of color projection fringes in 3D contour measurement
In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this...
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| Published in | Optoelectronics letters Vol. 11; no. 4; pp. 303 - 306 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
Tianjin
Tianjin University of Technology
01.07.2015
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1673-1905 1993-5013 |
| DOI | 10.1007/s11801-015-5050-x |
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| Abstract | In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction. |
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| AbstractList | In the three-dimensional (3D) contour measurement, the phase shift profilometry (PSP) method is the most widely used one. However, the measurement speed of PSP is very low because of the multiple projections. In order to improve the measurement speed, color grating stripes are used for measurement in this paper. During the measurement, only one color sinusoidal fringe is projected on the measured object. Therefore, the measurement speed is greatly improved. Since there is coupling or interference phenomenon between the adjacent color grating stripes, a color correction method is used to improve the measurement results. A method for correcting nonlinear error of measurement system is proposed in this paper, and the sinusoidal property of acquired image after correction is better than that before correction. Experimental results show that with these correction methods, the measurement errors can be reduced. Therefore, it can support a good foundation for the high-precision 3D reconstruction. In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction. |
| Author | 宋丽梅 李宗艳 陈昌曼 习江涛 郭庆华 李晓捷 |
| AuthorAffiliation | Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin 300387, China Department of Electricity Examination, Patent Examination Cooperation Tianjin Center of the Patent Office, State Intellectual Property Office, Tianjin 300304, China School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville 2500, Australia |
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| Keywords | Measurement Speed Unwrap Phase Interference Phenomenon Nonlinear Error Blue Channel |
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| Notes | SONG Li-mei, LI Zong-yan, CHEN Chang-man , XI Jiang-tao , GUO Qing-hua, LI Xiao-jie （ 1. Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tian- fin 300387, China 2. Department of Electricity Examination, Patent Examination Cooperation Tianjin Center of the Patent Office, State Intellectual Property Office, Tianjin 300304, China 3. School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Keiraville 2500, Australia） 12-1370/TN correction contour projection grating correcting projected pixel sinusoidal fringe Tianjin In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is very low because of the multiple projections.In order to improve the measurement speed,color grating stripes are used for measurement in this paper.During the measurement,only one color sinusoidal fringe is projected on the measured object.Therefore,the measurement speed is greatly improved.Since there is coupling or interference phenomenon between the adjacent color grating stripes,a color correction method is used to improve the measurement results.A method for correcting nonlinear error of measurement system is proposed in this paper,and the sinusoidal property of acquired image after correction is better than that before correction.Experimental results show that with these correction methods,the measurement errors can be reduced.Therefore,it can support a good foundation for the high-precision 3D reconstruction. |
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| References_xml | – reference: ZhouC-lSiS-cGaoC-yLeiZ-kJournal of Optoelectronics·Laser2013241784 – reference: ChengXLuCMaMMaoXMeiTOptics Communications2013298542013OptCo.298...54C10.1016/j.optcom.2013.02.013 – reference: DaiS-jShaoMWangZ-PLiW-cJournal of Optoelectronics·Laser2014251540 – reference: HanP-YDaF-PGaiS-HJournal of Optoelectronics·Laser2010211359 – reference: HuL-yDaF-pWangL-yActa Optics Sinica201232129 – reference: SongLDongXXiJYuYYangCOptics & Laser Technology2013453192013OptLT..45..319S10.1016/j.optlastec.2012.06.029 – reference: SongLChangYLiZWangPXingGXiJOptics Express201422136412014OExpr..2213641S10.1364/OE.22.013641 – reference: CaspiDKiryatiNShamirJIEEE Transactions on Pattern Analysis and Machine Intelligence19982047010.1109/34.682177 – reference: DengFLiuCSzeWDengJFungK S MLeungWLam EdmundYOptical Engineering2012511487 – reference: DaFWangLHuLOptics & Laser Technology20124423322012OptLT..44.2332D10.1016/j.optlastec.2012.04.0280601.30001 – reference: SongL-mChenC-mChenZXiJYuY-gOptoelectronics Letters201391432013OptEL...9..143S10.1007/s11801-013-2395-x – reference: WilliamLVincentCSongZOptics Express201422128710.1364/OE.22.001287 – volume: 45 start-page: 319 year: 2013 ident: 5050_CR9 publication-title: Optics & Laser Technology doi: 10.1016/j.optlastec.2012.06.029 – volume: 9 start-page: 143 year: 2013 ident: 5050_CR10 publication-title: Optoelectronics Letters doi: 10.1007/s11801-013-2395-x – volume: 22 start-page: 13641 year: 2014 ident: 5050_CR11 publication-title: Optics Express doi: 10.1364/OE.22.013641 – volume: 20 start-page: 470 year: 1998 ident: 5050_CR12 publication-title: IEEE Transactions on Pattern Analysis and Machine Intelligence doi: 10.1109/34.682177 – volume: 44 start-page: 2332 year: 2012 ident: 5050_CR5 publication-title: Optics & Laser Technology doi: 10.1016/j.optlastec.2012.04.028 – volume: 298 start-page: 54 year: 2013 ident: 5050_CR7 publication-title: Optics Communications doi: 10.1016/j.optcom.2013.02.013 – volume: 24 start-page: 1784 year: 2013 ident: 5050_CR1 publication-title: Journal of Optoelectronics·Laser – volume: 51 start-page: 1487 year: 2012 ident: 5050_CR4 publication-title: Optical Engineering – volume: 21 start-page: 1359 year: 2010 ident: 5050_CR6 publication-title: Journal of Optoelectronics·Laser – volume: 22 start-page: 1287 year: 2014 ident: 5050_CR2 publication-title: Optics Express doi: 10.1364/OE.22.001287 – volume: 25 start-page: 1540 year: 2014 ident: 5050_CR3 publication-title: Journal of Optoelectronics·Laser – volume: 32 start-page: 129 year: 2012 ident: 5050_CR8 publication-title: Acta Optics Sinica |
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| Snippet | In the three-dimensional（3D） contour measurement,the phase shift profilometry（PSP） method is the most widely used one.However,the measurement speed of PSP is... In the three-dimensional (3D) contour measurement, the phase shift profilometry (PSP) method is the most widely used one. However, the measurement speed of PSP... |
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| SubjectTerms | Lasers Optical Devices Optics Photonics Physics Physics and Astronomy 三维轮廓测量 光栅条纹 彩色 投影条纹 条纹投影 校正方法 测量速度 非线性误差 |
| Title | A correction method of color projection fringes in 3D contour measurement |
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