Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD
The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition （DCJCVD）. X-ray diffraction, Raman spectroscopy and cathodoluminescence （CL） measurement are used to investigate the films structure and defects related to electron transition proper...
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| Published in | Optoelectronics letters Vol. 5; no. 5; pp. 356 - 358 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
Heidelberg
Tianjin University of Technology
01.09.2009
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| Subjects | |
| Online Access | Get full text |
| ISSN | 1673-1905 1993-5013 |
| DOI | 10.1007/s11801-009-9160-1 |
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| Abstract | The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition （DCJCVD）. X-ray diffraction, Raman spectroscopy and cathodoluminescence （CL） measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88° and 75.24°. A sharp peak at 1331.8 cm^-1 and a broad band at about 1250-1550 cm^-1 from Raman spectrum are attributed to diamond phase and sp2-type carbons, respectively. Two emission peaks at 440 nm and 530 nm, associated with dislocation defects and nitrogen and vacancy complexes respectively, are observed in cathodoluminescence spectrum. In addition, in order to understand both emission processes, a simple energy level scheme is suggested. |
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| AbstractList | The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition (DCJCVD). X-ray diffraction, Raman spectroscopy and cathodoluminescence (CL) measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88° and 75.24°. A sharp peak at 1331.8 cm
−1
and a broad band at about 1250–1550 cm
−1
from Raman spectrum are attributed to diamond phase and sp
2
-type carbons, respectively. Two emission peaks at 440 nm and 530 nm, associated with dislocation defects and nitrogen and vacancy complexes respectively, are observed in cathodoluminescence spectrum. In addition, in order to understand both emission processes, a simple energy level scheme is suggested. The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition （DCJCVD）. X-ray diffraction, Raman spectroscopy and cathodoluminescence （CL） measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88° and 75.24°. A sharp peak at 1331.8 cm^-1 and a broad band at about 1250-1550 cm^-1 from Raman spectrum are attributed to diamond phase and sp2-type carbons, respectively. Two emission peaks at 440 nm and 530 nm, associated with dislocation defects and nitrogen and vacancy complexes respectively, are observed in cathodoluminescence spectrum. In addition, in order to understand both emission processes, a simple energy level scheme is suggested. |
| Author | 王兰芳 陈希明 张忠朋 庄晋艳 李岚 |
| AuthorAffiliation | Tianjin Key Laboratory of Film Electronic and Communication Devices, School of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, China Tianjin Key Laboratory for Optoelectronic Materials and Devices, Institute of Material Physics, Tianjin University of Technology, Tianjin 300384, China Key Laboratory of Display Materials and Photoelectric Devices of Ministry of Education, Institute of Material Physics, Tianjin University of Technology, Tianjin 300384, China |
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| Keywords | Vacancy Complex Synthetic Diamond Cathodoluminescence Spectrum Dislocation Defect Diamond Film |
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| Snippet | The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition （DCJCVD）. X-ray diffraction, Raman... The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition (DCJCVD). X-ray diffraction, Raman... |
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| SubjectTerms | Lasers Optical Devices Optics Photonics Physics Physics and Astronomy X射线衍射 制备 发射特性 喷射沉积 多晶金刚石 直流 荧光 金刚石薄膜 |
| Title | Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD |
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