Field emissions of graphene films deposited on different substrates by CVD system

Graphene films are deposited on copper (Cu) and aluminum (Al) substrates, respectively, by using a microwave plasma chemical vapour deposition technique. Furthermore, these graphene films are characterized by a field emission type scanning electron microscope (FE-SEM), Raman spectra, and field emiss...

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Published inChinese physics B Vol. 21; no. 12; pp. 499 - 502
Main Author 王小平 刘晓菲 刘欣欣 王丽军 杨灿 井龙伟 李松坤 潘秀芳
Format Journal Article
LanguageEnglish
Published 01.12.2012
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Summary:Graphene films are deposited on copper (Cu) and aluminum (Al) substrates, respectively, by using a microwave plasma chemical vapour deposition technique. Furthermore, these graphene films are characterized by a field emission type scanning electron microscope (FE-SEM), Raman spectra, and field emission (FE) I-V measurements. It is found that the surface morphologies of the films deposited on Cu and Al substrates are different: the field emission property of graphene film deposited on the Cu substrate is better than that on the Al substrate, and the lowest turn-on field of 2.4 V/p-m is obtained for graphene film deposited on the Cu substrate. The macroscopic areas of the graphene samples are all above 400 mm2.
Bibliography:Graphene films are deposited on copper (Cu) and aluminum (Al) substrates, respectively, by using a microwave plasma chemical vapour deposition technique. Furthermore, these graphene films are characterized by a field emission type scanning electron microscope (FE-SEM), Raman spectra, and field emission (FE) I-V measurements. It is found that the surface morphologies of the films deposited on Cu and Al substrates are different: the field emission property of graphene film deposited on the Cu substrate is better than that on the Al substrate, and the lowest turn-on field of 2.4 V/p-m is obtained for graphene film deposited on the Cu substrate. The macroscopic areas of the graphene samples are all above 400 mm2.
graphene, chemical vapour deposition, field emission
11-5639/O4
Wang Xiao-Ping, Liu Xiao-Fei, Liu Xin-Xin Wang Li-Jun, Yang Can, Jing Long-Wei, Li Song-Kun, and Pan Xiu-Fang College of Science, University of Shanghai for Science and Technology, Shanghai 200093, China
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/21/12/128102