Phase analysis of tungsten and phonon behavior of beryllium layers in W/Be periodic multilayers

• Published in: Physical chemistry chemical physics : PCCP Vol. 23; no. 4; pp. 2333 - 23312
• Main Authors: Kumar, Niranjan, Pleshkov, Roman S, Nezhdanov, Aleksey V, Yunin, Pavel A, Polkovnikov, Vladimir N, Chkhalo, Nikolay I, Mashin, Aleksandr I
• Format: Journal Article
• Language: English
• Published: Cambridge Royal Society of Chemistry 20.10.2021
• Subjects: Annealing; Beryllium; Compressive properties; Crystal defects; Film thickness; Multilayers; Phonons; Raman spectra

In periodic W/Be multilayers, thickness-dependent microstructural and phase modifications were investigated in W and Be layers. In X-ray diffraction, α-W was predominant for the ultrathin layer of W, while β-W evolved along with the α-W phase for higher film thickness. For the thicker layers, the th...