Transients in light illuminated photorefractive sandwiches in the presence of surface states and of a d.c. voltage - Kalinin, V.; Solymar, L. (Optics communications, 2000)
Keywords: Accumulation layer; Depletion layer; Edge effects; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Nonlinear optics; Optical materials; Optics; Other nonlinear optical materials; photorefractive and semiconductor materials; Phase conjugation, optical mixing, and photorefractive effect; Phase conjugation, optical mixing; photorefractive and kerr effects; Photorefractive material; Physics; Surface state; Thin film; Transient process; 42.65.−k; 72.40.+w; Transient process; Photorefractive material; Edge effects; Depletion layer; Surface state; Thin film; Accumulation layer; Thin films; Depletion layers; Accumulation layers; Edge effect; Numerical solution; Photorefractive materials; Theoretical study; Boundary conditions; Optical materials; Analytical solution; Surface states; Transients