APA (7th ed.) Citation

Rzepa, G., Franco, J., O’Sullivan, B., Subirats, A., Simicic, M., Hellings, G., . . . Grasser, T. (2018). Comphy — A compact-physics framework for unified modeling of BTI. Microelectronics and reliability, 85, 49-65. https://doi.org/10.1016/j.microrel.2018.04.002

Chicago Style (17th ed.) Citation

Rzepa, G., et al. "Comphy — A Compact-physics Framework for Unified Modeling of BTI." Microelectronics and Reliability 85 (2018): 49-65. https://doi.org/10.1016/j.microrel.2018.04.002.

MLA (9th ed.) Citation

Rzepa, G., et al. "Comphy — A Compact-physics Framework for Unified Modeling of BTI." Microelectronics and Reliability, vol. 85, 2018, pp. 49-65, https://doi.org/10.1016/j.microrel.2018.04.002.