Reliability experiments of sintered silver based interconnections by accelerated isothermal bending tests

Integration of more functionality and smaller chips into decreasing package volume leads to increasing heat generation. In addition, the use of new compound semiconductors like SiC and GaN require a high thermal conductivity of the interconnect materials. One of the promising solutions is a layer of...

Full description

Saved in:
Bibliographic Details
Published inMicroelectronics and reliability Vol. 74; pp. 136 - 146
Main Authors Heilmann, Jens, Nikitin, Ivan, Zschenderlein, Uwe, May, Daniel, Pressel, Klaus, Wunderle, Bernhard
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.07.2017
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Integration of more functionality and smaller chips into decreasing package volume leads to increasing heat generation. In addition, the use of new compound semiconductors like SiC and GaN require a high thermal conductivity of the interconnect materials. One of the promising solutions is a layer of sintered silver between semiconductor and substrate. The advantages compared to conventional solders are significant. A higher thermal and electrical conductivity in combination with a higher duty temperature due to a higher melting point should enhance the reliability of the package. However, even as the large scale commercial usage of the material has been started by the industry recently, many important details of the mechanical properties and the reliability behavior are still unknown. While the thermal properties could be characterized relatively easy and are quite repeatable and stable, the mechanical properties - important for the reliability - are extremely process-dependent and wide-spreading. The hunt for lowest feasible sintering process parameters - such as temperature, time and especially pressure - even amplify that behavior and led to an impasse in some cases. Also their failure mechanisms, to be identified in lifetime investigations, are yet unknown as well as their stability and predictability. In order to enable prolonged function of these interfaces, thermo-mechanical reliability has to be assured. Within this paper, we show the status of silver sintering and the problems regarding mechanical material characterization found in literature. Additionally, we present a guideline for the mechanical acceleration of reliability experiments by isothermal bending tests. Finally a proof of concept by failure analysis will be presented. •A review of the state of the art of silver sintering is given.•A concept for mechanical acceleration of lifetime-modelling is presented.•Experimental results of mechanical fatigue tests using nano-silver are presented.•Physics of failure analysis indicates, that mechanical acceleration of fatigue tests can be possible for sintered silver.
AbstractList Integration of more functionality and smaller chips into decreasing package volume leads to increasing heat generation. In addition, the use of new compound semiconductors like SiC and GaN require a high thermal conductivity of the interconnect materials. One of the promising solutions is a layer of sintered silver between semiconductor and substrate. The advantages compared to conventional solders are significant. A higher thermal and electrical conductivity in combination with a higher duty temperature due to a higher melting point should enhance the reliability of the package. However, even as the large scale commercial usage of the material has been started by the industry recently, many important details of the mechanical properties and the reliability behavior are still unknown. While the thermal properties could be characterized relatively easy and are quite repeatable and stable, the mechanical properties - important for the reliability - are extremely process-dependent and wide-spreading. The hunt for lowest feasible sintering process parameters - such as temperature, time and especially pressure - even amplify that behavior and led to an impasse in some cases. Also their failure mechanisms, to be identified in lifetime investigations, are yet unknown as well as their stability and predictability. In order to enable prolonged function of these interfaces, thermo-mechanical reliability has to be assured. Within this paper, we show the status of silver sintering and the problems regarding mechanical material characterization found in literature. Additionally, we present a guideline for the mechanical acceleration of reliability experiments by isothermal bending tests. Finally a proof of concept by failure analysis will be presented. •A review of the state of the art of silver sintering is given.•A concept for mechanical acceleration of lifetime-modelling is presented.•Experimental results of mechanical fatigue tests using nano-silver are presented.•Physics of failure analysis indicates, that mechanical acceleration of fatigue tests can be possible for sintered silver.
Author Nikitin, Ivan
May, Daniel
Zschenderlein, Uwe
Wunderle, Bernhard
Pressel, Klaus
Heilmann, Jens
Author_xml – sequence: 1
  givenname: Jens
  surname: Heilmann
  fullname: Heilmann, Jens
  email: jens.heilmann@etit.tu-chemnitz.de
  organization: Technische Universität Chemnitz, Lehrstuhl Werkstoffe und Zuverlässigkeit mikrotechnischer Systeme, Chemnitz, Germany
– sequence: 2
  givenname: Ivan
  surname: Nikitin
  fullname: Nikitin, Ivan
  organization: Infineon Technologies, Regensburg, Germany
– sequence: 3
  givenname: Uwe
  surname: Zschenderlein
  fullname: Zschenderlein, Uwe
  organization: Technische Universität Chemnitz, Lehrstuhl Werkstoffe und Zuverlässigkeit mikrotechnischer Systeme, Chemnitz, Germany
– sequence: 4
  givenname: Daniel
  surname: May
  fullname: May, Daniel
  organization: Technische Universität Chemnitz, Lehrstuhl Werkstoffe und Zuverlässigkeit mikrotechnischer Systeme, Chemnitz, Germany
– sequence: 5
  givenname: Klaus
  surname: Pressel
  fullname: Pressel, Klaus
  organization: Infineon Technologies, Regensburg, Germany
– sequence: 6
  givenname: Bernhard
  surname: Wunderle
  fullname: Wunderle, Bernhard
  organization: Technische Universität Chemnitz, Lehrstuhl Werkstoffe und Zuverlässigkeit mikrotechnischer Systeme, Chemnitz, Germany
BookMark eNqFkN1KAzEQhYNUsK2-guQFds3Puj_ghVK0CgVBFLwL2WSiKWm2JKHYtzdr9cabXs3MGc6B883QxA8eELqkpKSE1lfrcmNVGAK4khHalKQqs3yCprRtWNFV9H2CpoSwumANrc7QLMY1IaQhlE6RfQFnZW-dTXsMX1sIdgM-RTwYHK1PEEDnxe0g4F7GfPyIavAeVLKDj7jfY6kUOAgyjf84pE8IG-lwD15b_4ETxBTP0amRLsLF75yjt4f718VjsXpePi3uVoXilKVCVY1qlNaVIqblnZFMd21Hoe7y3dZSNrJlivecGcn5NaWaqarvDak1J9xoPkf1ITcziTGAEdvcSYa9oESMwMRa_AETIzBBKpHlbLz5Z1Q2ybFjCtK64_bbgx1yuZ2FIKKy4BVoGzIqoQd7LOIbusaSTw
CitedBy_id crossref_primary_10_1016_j_engfailanal_2024_109028
crossref_primary_10_1016_j_microrel_2022_114601
crossref_primary_10_1016_j_microrel_2024_115528
crossref_primary_10_1016_j_microrel_2023_114973
crossref_primary_10_1109_TCPMT_2023_3242423
crossref_primary_10_1109_TCPMT_2019_2944349
crossref_primary_10_1007_s40799_023_00664_y
crossref_primary_10_1109_TCPMT_2024_3360411
crossref_primary_10_3390_en17164105
crossref_primary_10_1007_s10854_021_07474_1
crossref_primary_10_1115_1_4053028
crossref_primary_10_1002_adem_201900245
crossref_primary_10_1016_j_mechmat_2020_103391
crossref_primary_10_1109_TCPMT_2024_3382131
crossref_primary_10_5104_jiep_26_448
crossref_primary_10_1088_1361_6439_ab26ff
crossref_primary_10_3390_ma16124472
crossref_primary_10_1109_TCPMT_2023_3298744
Cites_doi 10.1016/j.pmatsci.2005.08.003
10.1007/s00542-009-0907-1
10.1016/j.mechmat.2014.02.001
10.1115/1.1371781
10.1016/j.msea.2010.07.012
10.4028/www.scientific.net/MSF.524-525.121
10.1106/HLB3-MJC8-JVYL-9A9P
10.1109/TDMR.2013.2278979
10.1016/S1359-6462(03)00396-8
10.1111/j.1551-2916.2004.00192.x
10.1109/TDMR.2006.882196
10.1016/j.microrel.2013.07.103
10.1016/j.microrel.2006.04.010
10.1007/s11664-012-1903-2
10.1007/s00542-009-0860-z
10.1016/j.matdes.2009.04.006
ContentType Journal Article
Copyright 2017 Elsevier Ltd
Copyright_xml – notice: 2017 Elsevier Ltd
DBID AAYXX
CITATION
DOI 10.1016/j.microrel.2017.04.016
DatabaseName CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1872-941X
EndPage 146
ExternalDocumentID 10_1016_j_microrel_2017_04_016
S0026271417301063
GroupedDBID --K
--M
.DC
.~1
0R~
123
1B1
1~.
1~5
29M
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
AAYFN
ABBOA
ABFNM
ABFRF
ABJNI
ABMAC
ABXDB
ABXRA
ABYKQ
ACDAQ
ACGFS
ACNNM
ACRLP
ACZNC
ADBBV
ADEZE
ADJOM
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AHZHX
AIALX
AIEXJ
AIKHN
AITUG
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
AOUOD
AXJTR
AZFZN
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
GBLVA
GBOLZ
HVGLF
HZ~
IHE
J1W
JJJVA
KOM
LY7
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
RXW
SDF
SDG
SES
SET
SEW
SPC
SPCBC
SPD
SSM
SST
SSV
SSZ
T5K
T9H
TAE
UHS
UNMZH
WUQ
XOL
ZMT
~G-
AATTM
AAXKI
AAYWO
AAYXX
ABWVN
ACRPL
ACVFH
ADCNI
ADNMO
AEIPS
AEUPX
AFJKZ
AFPUW
AFXIZ
AGCQF
AGQPQ
AGRNS
AIGII
AIIUN
AKBMS
AKRWK
AKYEP
ANKPU
APXCP
BNPGV
CITATION
SSH
ID FETCH-LOGICAL-c312t-c47c7cdd4c0f839fa2d9891e690f886aa7a82c3b32fa33511d2c4bbf06d303fd3
IEDL.DBID .~1
ISSN 0026-2714
IngestDate Tue Jul 01 01:27:24 EDT 2025
Thu Apr 24 23:11:08 EDT 2025
Fri Feb 23 02:18:37 EST 2024
IsPeerReviewed true
IsScholarly true
Keywords Physics of failure
Continuum mechanics
Accelerated fatigue test
Reliability
Lifetime modelling
Sintered silver
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c312t-c47c7cdd4c0f839fa2d9891e690f886aa7a82c3b32fa33511d2c4bbf06d303fd3
PageCount 11
ParticipantIDs crossref_primary_10_1016_j_microrel_2017_04_016
crossref_citationtrail_10_1016_j_microrel_2017_04_016
elsevier_sciencedirect_doi_10_1016_j_microrel_2017_04_016
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate July 2017
2017-07-00
PublicationDateYYYYMMDD 2017-07-01
PublicationDate_xml – month: 07
  year: 2017
  text: July 2017
PublicationDecade 2010
PublicationTitle Microelectronics and reliability
PublicationYear 2017
Publisher Elsevier Ltd
Publisher_xml – name: Elsevier Ltd
References Elger, Kandaswamy, von Kouven, Derix, Conti (bb0220) 2014
Krupp (bb0240) 2004
Wunderle, Michel (bb0040) June 2009; 15
Spraul (bb0025) 2007
Durand, Klingler, Coutellier, Naceur (bb0190) 2014
Obaidat, Hamasha, Jaradat, Qasaimeh, Arfaei, Anselm, Borgesen (bb0055) 2013
Dudek, Doring, Rzepka, Ehrhardt, Glintherm, Haag (bb0175) 2015
Chen, SUN, Nie, Mei, Lu, Chen (bb0180) 2012; 41
Meyers, Mishra, Benson (bb0235) 2006; 51
Wang, Cheng, Becker, Wilde (bb0185) 2001; 123
Li, Chen, Chen, Lu, Wang, Mei (bb0155) 2012
Krueger, Trampert, Middendorf, Schmitz, Lang (bb0035) 2014
Herboth, Guenther, Fix, Wilde (bb0105) 2013
Zhang, Koga, Jiu, Nagao, Izumi, Yokoi, Suganuma (bb0110) 2015
Wunderle, Schacht, Wittler, Michel, Reichl (bb0005) 2004
Wanga, Chena, Wang, Chena, Luc (bb0140) 2010; A527
Yu, Chen, Chen, Lu, Wang (bb0195) 2009; 30
Sabuncuoglul, Vanhee, Willems, Vandevelde, Vandepitte, Wolf (bb0260) 2012
Chen, Zhang, Mei, Li, Yu, Wang, Chen (bb0160) 2014; 72
Bai, Lu (bb0210) 2006; 6
Tan, Li, Li, Chen (bb0225) 2013
Heilmann, Arnold, Wunderle (bb0045) 2015
Amro, Lutz (bb0100) 2005
Goebl, Faltenbacher (bb0085) 2010
Hutzler, Tokarski, Kraft, Zischler, Schletz (bb0090) 2014
Vogel, Auerswald, Auersperg, Rzepka, Michel (bb0245) 2013
Michel, Wunderle (bb0010) 2003
Hutzler, Tokarski, Schletz (bb0200) 2015
Weber, Hutter, Schmitz, Lang (bb0115) 2015
Mroszko, Oppermann, Wunderle, Michel (bb0150) 2011
Wittler, Nejadari, Michel (bb0050) 2009
Dudek, Doring, Sommer, Seiler, Kreyssig, WaIter, Becker, Glinther (bb0170) 2014
Caruso, Dasgupta (bb0255) 1998
Mohanram, Messing, Green (bb0270) 2004; 87
Nikitin, Pressel (bb0120) 2014
Lai, Wang, Tsai, Jen (bb0265) January 2007; 47
Jaradat, Owens, Qasaimeh, Arfaei, Yin, Anselm, Borgesen (bb0305) 2010
Deplanque (bb0215) 2007
Mei, Cao, Chen, Li, Lu, Chen (bb0295) 2014; 14
Bai, Zhang, Calata, Lu (bb0135) 2005
Heuck (bb0165) 2004
Meier, Roellig, Schiessl, Wolter (bb0290) 2014
Che, Pang, Wong, Lim, Low (bb0280) 2003
Heuck, Guth, Thoben, Mueller, Oeschler, Boewer, Speckels, Krasel, Ciliox (bb0205) 2014
Eisele, Rudzki, Kock (bb0065) 2007
Basaran, Cartwright, Zhao (bb0275) 2010; 10
Lu, Catala, Chen (bb0070) 2007
Ma (bb0230) 2003; 49
Keller, Gollhardt, Vogel, Auerswald, Sabate, Auersperg, Michel (bb0250) 2006; 524-525
Yang, Yin, Arfaei, Roggeman, Borgesen (bb0300) 2010
Knoerr, Kraft, Schletz (bb0130) 2010
Zhao, Basaran, Cartwright, Dishongh (bb0285) 2000
Mertens, Rudzki, Sittig (bb0095) 2004
Riva, Buttay, Allard, Bevilacqua (bb0075) 2013
Fellner, Fuchs, Antretter, Pinter, Schoengrundner (bb0030) 2014
Wunderle, Becker, Sinning, Wittler, Schacht, Walter, Schneider-Ramelow, Halser, Simper, Michel, Reichl (bb0015) 2009; 15
Mohammed, Al-Saraf, Al-Alkawi (bb0020) 2011; 4
Schacht, Wunderle, Auerswald, Michel, Reichl (bb0060) 2006
DeVoto, Paret (bb0080) 2014
Knoerr, Schletz, Oertel, Jank (bb0125) 2010
Caccuri, Milhet, Gaudaud, Bertheau (bb0145) 2014
Wunderle (10.1016/j.microrel.2017.04.016_bb0015) 2009; 15
Elger (10.1016/j.microrel.2017.04.016_bb0220) 2014
Meier (10.1016/j.microrel.2017.04.016_bb0290) 2014
Li (10.1016/j.microrel.2017.04.016_bb0155) 2012
Fellner (10.1016/j.microrel.2017.04.016_bb0030) 2014
Schacht (10.1016/j.microrel.2017.04.016_bb0060) 2006
Heuck (10.1016/j.microrel.2017.04.016_bb0165) 2004
Caccuri (10.1016/j.microrel.2017.04.016_bb0145) 2014
Heilmann (10.1016/j.microrel.2017.04.016_bb0045) 2015
DeVoto (10.1016/j.microrel.2017.04.016_bb0080) 2014
Bai (10.1016/j.microrel.2017.04.016_bb0135) 2005
Tan (10.1016/j.microrel.2017.04.016_bb0225) 2013
Lai (10.1016/j.microrel.2017.04.016_bb0265) 2007; 47
Wang (10.1016/j.microrel.2017.04.016_bb0185) 2001; 123
Mohammed (10.1016/j.microrel.2017.04.016_bb0020) 2011; 4
Mohanram (10.1016/j.microrel.2017.04.016_bb0270) 2004; 87
Nikitin (10.1016/j.microrel.2017.04.016_bb0120) 2014
Chen (10.1016/j.microrel.2017.04.016_bb0160) 2014; 72
Caruso (10.1016/j.microrel.2017.04.016_bb0255) 1998
Weber (10.1016/j.microrel.2017.04.016_bb0115) 2015
Zhao (10.1016/j.microrel.2017.04.016_bb0285) 2000
Wunderle (10.1016/j.microrel.2017.04.016_bb0005) 2004
Deplanque (10.1016/j.microrel.2017.04.016_bb0215) 2007
Chen (10.1016/j.microrel.2017.04.016_bb0180) 2012; 41
Knoerr (10.1016/j.microrel.2017.04.016_bb0125) 2010
Keller (10.1016/j.microrel.2017.04.016_bb0250) 2006; 524-525
Hutzler (10.1016/j.microrel.2017.04.016_bb0200) 2015
Dudek (10.1016/j.microrel.2017.04.016_bb0175) 2015
Yu (10.1016/j.microrel.2017.04.016_bb0195) 2009; 30
Vogel (10.1016/j.microrel.2017.04.016_bb0245) 2013
Ma (10.1016/j.microrel.2017.04.016_bb0230) 2003; 49
Bai (10.1016/j.microrel.2017.04.016_bb0210) 2006; 6
Knoerr (10.1016/j.microrel.2017.04.016_bb0130) 2010
Wittler (10.1016/j.microrel.2017.04.016_bb0050) 2009
Riva (10.1016/j.microrel.2017.04.016_bb0075) 2013
Krupp (10.1016/j.microrel.2017.04.016_bb0240) 2004
Wanga (10.1016/j.microrel.2017.04.016_bb0140) 2010; A527
Eisele (10.1016/j.microrel.2017.04.016_bb0065) 2007
Lu (10.1016/j.microrel.2017.04.016_bb0070) 2007
Jaradat (10.1016/j.microrel.2017.04.016_bb0305) 2010
Wunderle (10.1016/j.microrel.2017.04.016_bb0040) 2009; 15
Che (10.1016/j.microrel.2017.04.016_bb0280) 2003
Obaidat (10.1016/j.microrel.2017.04.016_bb0055) 2013
Mertens (10.1016/j.microrel.2017.04.016_bb0095) 2004
Basaran (10.1016/j.microrel.2017.04.016_bb0275) 2010; 10
Hutzler (10.1016/j.microrel.2017.04.016_bb0090) 2014
Mroszko (10.1016/j.microrel.2017.04.016_bb0150) 2011
Goebl (10.1016/j.microrel.2017.04.016_bb0085) 2010
Zhang (10.1016/j.microrel.2017.04.016_bb0110) 2015
Krueger (10.1016/j.microrel.2017.04.016_bb0035) 2014
Herboth (10.1016/j.microrel.2017.04.016_bb0105) 2013
Heuck (10.1016/j.microrel.2017.04.016_bb0205) 2014
Yang (10.1016/j.microrel.2017.04.016_bb0300) 2010
Meyers (10.1016/j.microrel.2017.04.016_bb0235) 2006; 51
Durand (10.1016/j.microrel.2017.04.016_bb0190) 2014
Spraul (10.1016/j.microrel.2017.04.016_bb0025) 2007
Sabuncuoglul (10.1016/j.microrel.2017.04.016_bb0260) 2012
Amro (10.1016/j.microrel.2017.04.016_bb0100) 2005
Dudek (10.1016/j.microrel.2017.04.016_bb0170) 2014
Mei (10.1016/j.microrel.2017.04.016_bb0295) 2014; 14
Michel (10.1016/j.microrel.2017.04.016_bb0010) 2003
References_xml – volume: 15
  start-page: 1467
  year: 2009
  end-page: 1478
  ident: bb0015
  article-title: Thermo-mechanical reliability during technology development of power chip-on-board assemblies with encapsulation
  publication-title: J. Microsyst. Technol.
– volume: 524-525
  start-page: 121
  year: 2006
  end-page: 126
  ident: bb0250
  article-title: FibDAC - residual stress determination by combination of focused ion beam technique and digital image correlation
  publication-title: Mater. Sci. Forum
– volume: 6
  start-page: 436
  year: 2006
  end-page: 441
  ident: bb0210
  article-title: Thermomechanical Reliability of low-temperature sintered silver die attached SiC power device assembly
  publication-title: IEEE Trans. Device Mater Reliab.
– start-page: 149
  year: 2011
  end-page: 154
  ident: bb0150
  article-title: Reliability analysis of low temperature low pressure Ag-sinter die attach
  publication-title: NSTI Nanotechnology Conference and Expo
– year: 2014
  ident: bb0205
  article-title: Aging of new interconnect-technologies of power-modules during power-cycling
  publication-title: International Conference on Integrated Power Systems (CIPS)
– year: 2005
  ident: bb0135
  article-title: Characterization of low-temperature sintered nanoscale silver paste for attaching semiconductor devices
  publication-title: High Density Microsystem Design and Packaging and Component Failure Analysis, Conference
– start-page: 1592
  year: 2013
  end-page: 1596
  ident: bb0075
  article-title: Migration issues in sintered-silver die attaches operating at high temperature
  publication-title: Microelectron. Reliab. J.
– year: 2014
  ident: bb0290
  article-title: Reliability study on chip capacitor solder joints under thermo-mechanical and vibration loading
  publication-title: EuroSimE Conference
– year: 2010
  ident: bb0300
  article-title: On the assessment of the life of SnAgCu solder joints in cycling with varying amplitudes
  publication-title: IEEE Trans. Compon. Packag. Technol.
– year: 2007
  ident: bb0025
  article-title: Lebensdauerprognosen fuer geloetete Bauteile mit Zinn-Blei und Zinn-Silber-Kupfer Lot fuer Temperaturwechselpruefungen
– start-page: 1308
  year: 2013
  end-page: 1314
  ident: bb0055
  article-title: Effects of varying amplitudes on the fatigue life of lead free solder joints
  publication-title: 15th Electronic Components and Technology Conference
– year: 2004
  ident: bb0240
  article-title: Mikrostrukturelle Aspekte der Rissinitiierung und -ausbreitung in metallischen Werkstoffen
– year: 2007
  ident: bb0215
  article-title: Lifetime Prediction for Solder Die-attach in Power Applications by Means of Primary and Secondary Creep
– year: 2010
  ident: bb0085
  article-title: Low temperature sinter technology die attachment for power electronic applications
– year: 2014
  ident: bb0220
  article-title: In-situ measurements of the relative thermal resistance: highly sensitive method to detect crack propagation in solder joints
  publication-title: Electronic Components and Technology Conference
– volume: 49
  start-page: 663
  year: 2003
  end-page: 668
  ident: bb0230
  article-title: Instabilities and ductility of nanocrystalline and ultrafine-grained metals
  publication-title: Scr. Mater.
– start-page: 1
  year: 2007
  end-page: 5
  ident: bb0070
  article-title: Low-temperature and pressureless sintering technology for high-performance and high-temperature interconnection of semiconductor devices
  publication-title: Eurosime Conference
– volume: 72
  start-page: 61
  year: 2014
  end-page: 71
  ident: bb0160
  article-title: Applying viscoplastic constitutive models to predict ratcheting behavior of sintered nanosilver lap-shear joint
  publication-title: J. Mech. Mater.
– year: 2015
  ident: bb0045
  article-title: Acceleration of lifetime modeling by isothermal bending fatigue tests
  publication-title: EuroSimE Conference
– volume: 14
  start-page: 262
  year: 2014
  end-page: 267
  ident: bb0295
  article-title: Characterization and reliability of sintered nanosilver joints by a rapid current-assisted method for power electronics packaging
  publication-title: Trans. Device Mater. Reliab.
– start-page: 174
  year: 2000
  end-page: 180
  ident: bb0285
  article-title: Inelastic behavior of microelectronics solder joints under concurrent vibration and thermal cycling
  publication-title: Inter Society Conference on Thermal Phenomena
– start-page: 1518
  year: 2010
  end-page: 1523
  ident: bb0305
  article-title: On the fatigue life of microelectronic interconnects in cycling with varying amplitudes
  publication-title: 60th Electronic Components and Technology Conference
– year: 2013
  ident: bb0225
  article-title: Fatigue and dwell-fatigue behavior of nano-silver sintered lap-shear joint at elevated temperature
  publication-title: 13th International Conference on Fracture, Beijing, China
– year: 2007
  ident: bb0065
  article-title: Pressure sintering for thermal stack assembly
  publication-title: International Exhibition and Conference for Power Electronics, Intelligent Motion and Power Quality
– volume: 4
  year: 2011
  ident: bb0020
  article-title: Thermomechanical fatigue damage model for life prediction of navel copper alloy
  publication-title: Panbar J. Eng. Sci.
– volume: 47
  start-page: 111
  year: January 2007
  end-page: 117
  ident: bb0265
  article-title: Cyclic bending reliability of wafer-level chip-scale packages
  publication-title: J. Microelectron. Reliab.
– year: 2014
  ident: bb0080
  article-title: Stress intensity of delamination in a sintered-silver interconnection
  publication-title: IMAPS/HiTEC
– start-page: 11
  year: 2004
  end-page: 16
  ident: bb0005
  article-title: Performance and thermo-mechanical reliability of micro-channel coolers - a parametric study
  publication-title: Itherm Conference, Las Vegas, USA, June 1–4
– year: 2006
  ident: bb0060
  article-title: Accelerated active high-temperature cycling test for power MOSFETs
  publication-title: Itherm Conference
– start-page: 120
  year: 2012
  end-page: 126
  ident: bb0155
  article-title: Mechanical property evaluation of nano-silver paste sintered joint using lap-shear test
– volume: 15
  start-page: 799
  year: June 2009
  end-page: 813
  ident: bb0040
  article-title: Lifetime Modeling for microsystems integration - from nano to systems
  publication-title: J. Microsyst. Technol.
– start-page: 4178
  year: 2004
  end-page: 4182
  ident: bb0095
  article-title: Topside chip contacts with low temperature joining technique (LTJT)
  publication-title: 351h Annual IEEE Power Elecrronics Specialists Conference
– year: 2003
  ident: bb0010
  article-title: Simulation and reliability on the way from micro to nano
  publication-title: 21st Cadfem Users Meeting, Potsdam, Germany, Nov. 12–14
– year: 2014
  ident: bb0190
  article-title: Failure mechanisms in chip-metallization in power applications
  publication-title: EuroSimE Conference
– year: 2014
  ident: bb0090
  article-title: Increasing the lifetime of electronic packaging by higher temperatures: solders vs. silver sintering
  publication-title: Electronic Components and Technology Conference
– volume: 51
  start-page: 427
  year: 2006
  end-page: 556
  ident: bb0235
  article-title: Mechanical properties of nanocrystalline materials
  publication-title: Prog. Mater. Sci.
– year: 2014
  ident: bb0030
  article-title: Determination of cyclic mechanical properties of thin copper layers for PCB applications
  publication-title: EuroSimE conference
– year: 2015
  ident: bb0200
  article-title: High temperature die-attach materials for aerospace power electronics: lifetime tests and modeling
  publication-title: Aerospace Conference, IEEE
– year: 2015
  ident: bb0110
  article-title: Low temperature die attach based on sub-micron Ag particles and the high temperature reliability of sintered joints
  publication-title: Electronic Components and Technology Conference
– year: 2005
  ident: bb0100
  article-title: Double-sided Low-temperature Joining Technique for Power Cycling Capability at High Temperature
– volume: 30
  start-page: 4574
  year: 2009
  end-page: 4579
  ident: bb0195
  article-title: Applying Anand model to low-temperature sintered nanoscale silver paste chip attachment
  publication-title: Mater. Des.
– start-page: 56
  year: 2010
  end-page: 61
  ident: bb0130
  article-title: Reliability assessment of sintered nano-silver die attachment for power semiconductors
  publication-title: 12th Electronics Packaging Technology Conference
– year: 2010
  ident: bb0125
  article-title: Power semiconductor joining through sintering of Ag-nanoparticles: analysis of suitability of different powders using DSC and TGA measurements
  publication-title: World Congress on Particle Technology. Abstracts and Proceedings
– start-page: 1621
  year: 2013
  end-page: 1627
  ident: bb0105
  article-title: Failure mechanisms of sintered silver interconnections for power electronic applications
  publication-title: Electronic Components and Technology Conference
– year: 2012
  ident: bb0260
  article-title: Finite element modeling of solder joint fatigue in four-point bending test
  publication-title: EuroSimE Conference
– year: 2014
  ident: bb0120
  article-title: Mechanical properties of porous silver materials depending on sintering parameters
  publication-title: 20th International Workshop on Thermal Investigations of ICs and Systems (Therminic)
– volume: 123
  start-page: 247
  year: 2001
  end-page: 253
  ident: bb0185
  article-title: Applying Anand model to represent the viscoplastic deformation behavior of solder alloys
  publication-title: J. Electron. Packag.
– start-page: 389
  year: 1998
  end-page: 393
  ident: bb0255
  article-title: A fundamental overview of accelerated testing analytical models
  publication-title: Proceedings Annual Reliability and Maintainability Symposium
– start-page: 107
  year: 2003
  end-page: 113
  ident: bb0280
  article-title: Vibration fatigue test and analysis for flip chip solder joints
  publication-title: Electronics Packaging Technology Conference
– volume: A527
  start-page: 6714
  year: 2010
  end-page: 6722
  ident: bb0140
  article-title: Uniaxial ratcheting and fatigue behaviors of low-temperature sintered nano-scale silver paste at room and high temperatures
  publication-title: Mater. Sci. Eng.
– year: 2014
  ident: bb0170
  article-title: Combined experimental- and FE-studies on sinter-Ag behaviour and effects on IGBT-module reliability
  publication-title: EuroSimE Conference
– year: 2013
  ident: bb0245
  article-title: Measuring techniques for deformation and stress analysis in micro-dimensions
  publication-title: EuroSime Conference
– volume: 41
  start-page: 782
  year: 2012
  end-page: 790
  ident: bb0180
  article-title: High-temperature creep behavior of low-temperature-sintered nano-silver paste films
  publication-title: J. Electron. Mater.
– year: 2004
  ident: bb0165
  article-title: Untersuchungen an silberbasierten Verbindungstechnologien fuer die Leistungs- und Hochtemperaturelektronik
– year: 2014
  ident: bb0035
  article-title: Early-state crack detection method for heel-cracks in wire bond interconnects
  publication-title: Electronic Components and Technology Conference
– year: 2014
  ident: bb0145
  article-title: Mechanical properties of sintered Ag as a new material for die bonding: influence of the density
  publication-title: Miner. Met. Mater. Soc.
– year: 2015
  ident: bb0115
  article-title: Dependency of the porosity and the layer thickness on the reliability of Ag sintered joints during active power cycling
  publication-title: Electronic Components and Technology Conference
– volume: 87
  start-page: 192
  year: 2004
  end-page: 196
  ident: bb0270
  article-title: Measurement of viscosity of densifying glass-based systems by isothermal cyclic loading dilatometry
  publication-title: J. Am. Ceram. Soc.
– start-page: 153
  year: 2009
  end-page: 157
  ident: bb0050
  article-title: Detection of degradation in die-attach materials by in-situ monitoring of thermal properties
  publication-title: 11th Electronics Packaging Technology Conference
– year: 2015
  ident: bb0175
  article-title: Electro-thermo-mechanical analyses on silver sintered IGBT-module reliability in power cycling
  publication-title: EuroSimE Conference
– volume: 10
  start-page: 153
  year: 2010
  end-page: 170
  ident: bb0275
  article-title: Experimental damage mechanics of microelectronics solder joints under concurrent vibration and thermal loading
  publication-title: Int. J. Damage Mech.
– volume: 51
  start-page: 427
  year: 2006
  ident: 10.1016/j.microrel.2017.04.016_bb0235
  article-title: Mechanical properties of nanocrystalline materials
  publication-title: Prog. Mater. Sci.
  doi: 10.1016/j.pmatsci.2005.08.003
– year: 2004
  ident: 10.1016/j.microrel.2017.04.016_bb0240
– year: 2003
  ident: 10.1016/j.microrel.2017.04.016_bb0010
  article-title: Simulation and reliability on the way from micro to nano
– year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0125
  article-title: Power semiconductor joining through sintering of Ag-nanoparticles: analysis of suitability of different powders using DSC and TGA measurements
– start-page: 174
  year: 2000
  ident: 10.1016/j.microrel.2017.04.016_bb0285
  article-title: Inelastic behavior of microelectronics solder joints under concurrent vibration and thermal cycling
– volume: 15
  start-page: 1467
  issue: 9
  year: 2009
  ident: 10.1016/j.microrel.2017.04.016_bb0015
  article-title: Thermo-mechanical reliability during technology development of power chip-on-board assemblies with encapsulation
  publication-title: J. Microsyst. Technol.
  doi: 10.1007/s00542-009-0907-1
– year: 2007
  ident: 10.1016/j.microrel.2017.04.016_bb0025
– start-page: 149
  year: 2011
  ident: 10.1016/j.microrel.2017.04.016_bb0150
  article-title: Reliability analysis of low temperature low pressure Ag-sinter die attach
– volume: 72
  start-page: 61
  year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0160
  article-title: Applying viscoplastic constitutive models to predict ratcheting behavior of sintered nanosilver lap-shear joint
  publication-title: J. Mech. Mater.
  doi: 10.1016/j.mechmat.2014.02.001
– start-page: 56
  year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0130
  article-title: Reliability assessment of sintered nano-silver die attachment for power semiconductors
– volume: 123
  start-page: 247
  year: 2001
  ident: 10.1016/j.microrel.2017.04.016_bb0185
  article-title: Applying Anand model to represent the viscoplastic deformation behavior of solder alloys
  publication-title: J. Electron. Packag.
  doi: 10.1115/1.1371781
– year: 2005
  ident: 10.1016/j.microrel.2017.04.016_bb0135
  article-title: Characterization of low-temperature sintered nanoscale silver paste for attaching semiconductor devices
– start-page: 153
  year: 2009
  ident: 10.1016/j.microrel.2017.04.016_bb0050
  article-title: Detection of degradation in die-attach materials by in-situ monitoring of thermal properties
– year: 2015
  ident: 10.1016/j.microrel.2017.04.016_bb0115
  article-title: Dependency of the porosity and the layer thickness on the reliability of Ag sintered joints during active power cycling
– volume: A527
  start-page: 6714
  year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0140
  article-title: Uniaxial ratcheting and fatigue behaviors of low-temperature sintered nano-scale silver paste at room and high temperatures
  publication-title: Mater. Sci. Eng.
  doi: 10.1016/j.msea.2010.07.012
– volume: 524-525
  start-page: 121
  year: 2006
  ident: 10.1016/j.microrel.2017.04.016_bb0250
  article-title: FibDAC - residual stress determination by combination of focused ion beam technique and digital image correlation
  publication-title: Mater. Sci. Forum
  doi: 10.4028/www.scientific.net/MSF.524-525.121
– volume: 10
  start-page: 153
  year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0275
  article-title: Experimental damage mechanics of microelectronics solder joints under concurrent vibration and thermal loading
  publication-title: Int. J. Damage Mech.
  doi: 10.1106/HLB3-MJC8-JVYL-9A9P
– start-page: 107
  year: 2003
  ident: 10.1016/j.microrel.2017.04.016_bb0280
  article-title: Vibration fatigue test and analysis for flip chip solder joints
– year: 2004
  ident: 10.1016/j.microrel.2017.04.016_bb0165
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0080
  article-title: Stress intensity of delamination in a sintered-silver interconnection
– volume: 14
  start-page: 262
  issue: 1
  year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0295
  article-title: Characterization and reliability of sintered nanosilver joints by a rapid current-assisted method for power electronics packaging
  publication-title: Trans. Device Mater. Reliab.
  doi: 10.1109/TDMR.2013.2278979
– year: 2015
  ident: 10.1016/j.microrel.2017.04.016_bb0200
  article-title: High temperature die-attach materials for aerospace power electronics: lifetime tests and modeling
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0090
  article-title: Increasing the lifetime of electronic packaging by higher temperatures: solders vs. silver sintering
– volume: 49
  start-page: 663
  year: 2003
  ident: 10.1016/j.microrel.2017.04.016_bb0230
  article-title: Instabilities and ductility of nanocrystalline and ultrafine-grained metals
  publication-title: Scr. Mater.
  doi: 10.1016/S1359-6462(03)00396-8
– start-page: 120
  year: 2012
  ident: 10.1016/j.microrel.2017.04.016_bb0155
– year: 2007
  ident: 10.1016/j.microrel.2017.04.016_bb0065
  article-title: Pressure sintering for thermal stack assembly
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0220
  article-title: In-situ measurements of the relative thermal resistance: highly sensitive method to detect crack propagation in solder joints
– volume: 87
  start-page: 192
  year: 2004
  ident: 10.1016/j.microrel.2017.04.016_bb0270
  article-title: Measurement of viscosity of densifying glass-based systems by isothermal cyclic loading dilatometry
  publication-title: J. Am. Ceram. Soc.
  doi: 10.1111/j.1551-2916.2004.00192.x
– start-page: 1518
  year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0305
  article-title: On the fatigue life of microelectronic interconnects in cycling with varying amplitudes
– start-page: 1621
  year: 2013
  ident: 10.1016/j.microrel.2017.04.016_bb0105
  article-title: Failure mechanisms of sintered silver interconnections for power electronic applications
– start-page: 389
  year: 1998
  ident: 10.1016/j.microrel.2017.04.016_bb0255
  article-title: A fundamental overview of accelerated testing analytical models
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0030
  article-title: Determination of cyclic mechanical properties of thin copper layers for PCB applications
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0170
  article-title: Combined experimental- and FE-studies on sinter-Ag behaviour and effects on IGBT-module reliability
– start-page: 1
  year: 2007
  ident: 10.1016/j.microrel.2017.04.016_bb0070
  article-title: Low-temperature and pressureless sintering technology for high-performance and high-temperature interconnection of semiconductor devices
– volume: 6
  start-page: 436
  issue: 3
  year: 2006
  ident: 10.1016/j.microrel.2017.04.016_bb0210
  article-title: Thermomechanical Reliability of low-temperature sintered silver die attached SiC power device assembly
  publication-title: IEEE Trans. Device Mater Reliab.
  doi: 10.1109/TDMR.2006.882196
– year: 2007
  ident: 10.1016/j.microrel.2017.04.016_bb0215
– start-page: 4178
  year: 2004
  ident: 10.1016/j.microrel.2017.04.016_bb0095
  article-title: Topside chip contacts with low temperature joining technique (LTJT)
– volume: 4
  issue: 2
  year: 2011
  ident: 10.1016/j.microrel.2017.04.016_bb0020
  article-title: Thermomechanical fatigue damage model for life prediction of navel copper alloy
  publication-title: Panbar J. Eng. Sci.
– year: 2006
  ident: 10.1016/j.microrel.2017.04.016_bb0060
  article-title: Accelerated active high-temperature cycling test for power MOSFETs
– year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0085
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0205
  article-title: Aging of new interconnect-technologies of power-modules during power-cycling
– year: 2015
  ident: 10.1016/j.microrel.2017.04.016_bb0110
  article-title: Low temperature die attach based on sub-micron Ag particles and the high temperature reliability of sintered joints
– start-page: 1308
  year: 2013
  ident: 10.1016/j.microrel.2017.04.016_bb0055
  article-title: Effects of varying amplitudes on the fatigue life of lead free solder joints
– start-page: 1592
  year: 2013
  ident: 10.1016/j.microrel.2017.04.016_bb0075
  article-title: Migration issues in sintered-silver die attaches operating at high temperature
  publication-title: Microelectron. Reliab. J.
  doi: 10.1016/j.microrel.2013.07.103
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0290
  article-title: Reliability study on chip capacitor solder joints under thermo-mechanical and vibration loading
– year: 2015
  ident: 10.1016/j.microrel.2017.04.016_bb0175
  article-title: Electro-thermo-mechanical analyses on silver sintered IGBT-module reliability in power cycling
– volume: 47
  start-page: 111
  issue: 1
  year: 2007
  ident: 10.1016/j.microrel.2017.04.016_bb0265
  article-title: Cyclic bending reliability of wafer-level chip-scale packages
  publication-title: J. Microelectron. Reliab.
  doi: 10.1016/j.microrel.2006.04.010
– year: 2013
  ident: 10.1016/j.microrel.2017.04.016_bb0225
  article-title: Fatigue and dwell-fatigue behavior of nano-silver sintered lap-shear joint at elevated temperature
– volume: 41
  start-page: 782
  issue: 4
  year: 2012
  ident: 10.1016/j.microrel.2017.04.016_bb0180
  article-title: High-temperature creep behavior of low-temperature-sintered nano-silver paste films
  publication-title: J. Electron. Mater.
  doi: 10.1007/s11664-012-1903-2
– year: 2010
  ident: 10.1016/j.microrel.2017.04.016_bb0300
  article-title: On the assessment of the life of SnAgCu solder joints in cycling with varying amplitudes
  publication-title: IEEE Trans. Compon. Packag. Technol.
– year: 2005
  ident: 10.1016/j.microrel.2017.04.016_bb0100
– volume: 15
  start-page: 799
  issue: 6
  year: 2009
  ident: 10.1016/j.microrel.2017.04.016_bb0040
  article-title: Lifetime Modeling for microsystems integration - from nano to systems
  publication-title: J. Microsyst. Technol.
  doi: 10.1007/s00542-009-0860-z
– year: 2015
  ident: 10.1016/j.microrel.2017.04.016_bb0045
  article-title: Acceleration of lifetime modeling by isothermal bending fatigue tests
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0190
  article-title: Failure mechanisms in chip-metallization in power applications
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0120
  article-title: Mechanical properties of porous silver materials depending on sintering parameters
– year: 2013
  ident: 10.1016/j.microrel.2017.04.016_bb0245
  article-title: Measuring techniques for deformation and stress analysis in micro-dimensions
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0145
  article-title: Mechanical properties of sintered Ag as a new material for die bonding: influence of the density
  publication-title: Miner. Met. Mater. Soc.
– year: 2014
  ident: 10.1016/j.microrel.2017.04.016_bb0035
  article-title: Early-state crack detection method for heel-cracks in wire bond interconnects
– start-page: 11
  year: 2004
  ident: 10.1016/j.microrel.2017.04.016_bb0005
  article-title: Performance and thermo-mechanical reliability of micro-channel coolers - a parametric study
– volume: 30
  start-page: 4574
  year: 2009
  ident: 10.1016/j.microrel.2017.04.016_bb0195
  article-title: Applying Anand model to low-temperature sintered nanoscale silver paste chip attachment
  publication-title: Mater. Des.
  doi: 10.1016/j.matdes.2009.04.006
– year: 2012
  ident: 10.1016/j.microrel.2017.04.016_bb0260
  article-title: Finite element modeling of solder joint fatigue in four-point bending test
SSID ssj0007011
Score 2.3091338
Snippet Integration of more functionality and smaller chips into decreasing package volume leads to increasing heat generation. In addition, the use of new compound...
SourceID crossref
elsevier
SourceType Enrichment Source
Index Database
Publisher
StartPage 136
SubjectTerms Accelerated fatigue test
Continuum mechanics
Lifetime modelling
Physics of failure
Reliability
Sintered silver
Title Reliability experiments of sintered silver based interconnections by accelerated isothermal bending tests
URI https://dx.doi.org/10.1016/j.microrel.2017.04.016
Volume 74
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV07a8MwEBYhXdqh9EnTR9DQ1YktKZY9htCQtjRTA9mMnpDQPIjdIUt_e3Wy3aRQyNDNln22OR26M_q-7xB61JJwJUQcMBmpgFHVC2Qqo8CIhJielbH0vQjexvFowl6mvWkDDWouDMAqq7W_XNP9al2NdCtvdtezGXB8SUx4xCIIUpdpgcHOOER552sH8-BhVHbNI3EAd--xhOedBYDeNga2ICLuJU-h7_lfCWov6QzP0GlVLeJ--UHnqGGWF-hkT0PwEs0AVFyKbW_xTq8_xyuLcxCD2BjtDgAAjSFlaewHFQBcPKchx3KLhVIu_4BshLuee1bWwr1YGk96wa4eLfIrNBk-vQ9GQdU_IVA0IkWgGFdcac1UaF0dZAXRaZJGxv0Q2ySJheBuQhSVlFhBYUNRE8WktGGsXWKzml6j5nK1NDcIc2ptIq212j2OGNh7k4QyyoQyKRWyhXq10zJViYtDj4uPrEaRzbPa2Rk4OwtZ5oZbqPtjty7lNQ5apPWcZL8CJXM54IDt7T9s79AxnJVI3XvULDaf5sHVI4Vs-4Bro6P-8-to_A3UAuV3
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1LbxMxEB6FcAAOCEorUl4-wHGTrO3s48ABAVFKk5xaqTfjp5SKJlF2UZULf4o_yMw-SCoh9YByW9karzUezYzlb-YDeO8MT63WSSRNbCMp7CgyuYkjrzPuR8EkpuIimM2TyaX8djW66sDvthaGYJWN7699euWtm5FBo83BerGgGl-e8DSWMRkpRtoGWXnut7d4bys-nn3BQ_7A-fjrxedJ1FALRFbEvIysTG1qnZN2GDBFCJq7PMtjj3fFkGWJ1inu1QojeNCC3toct9KYMEwc-vzgBK77AB5KdBdEm9D_tcOVpMO4punjSUTb2ytLvu7fEMpu4-nNI06rHqtEtP6viLgX5cbP4GmTnrJPtQaeQ8cvj-DJXtPCF7AgFHPd3XvLdgQBBVsFVlD3iY13-EGIa0Yx0rFq0BKipiqiKJjZMm0tBjzqU4HzRVUGdoM_Nr6qsmGYAJfFMVweRKsn0F2ulv4lsFSEkJkQgsPluKfHPsOFFFJbnwttejBqlaZs082cSDV-qBa2dq1aZStSthpKhcM9GPyVW9f9PO6VyNszUXcsU2HQuUf29D9k38GjycVsqqZn8_NX8Jhmapjwa-iWm5_-DSZDpXlbGR-D74e29j9UyyH6
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Reliability+experiments+of+sintered+silver+based+interconnections+by+accelerated+isothermal+bending+tests&rft.jtitle=Microelectronics+and+reliability&rft.au=Heilmann%2C+Jens&rft.au=Nikitin%2C+Ivan&rft.au=Zschenderlein%2C+Uwe&rft.au=May%2C+Daniel&rft.date=2017-07-01&rft.issn=0026-2714&rft.volume=74&rft.spage=136&rft.epage=146&rft_id=info:doi/10.1016%2Fj.microrel.2017.04.016&rft.externalDBID=n%2Fa&rft.externalDocID=10_1016_j_microrel_2017_04_016
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0026-2714&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0026-2714&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0026-2714&client=summon