Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETs - Aichinger, Thomas; Rescher, Gerald; Pobegen, Gregor (Microelectronics and reliability, 2018)
Keywords: BTI; Device preconditioning; SiC MOSFET; Threshold voltage hysteresis; Vendor analysis; Device preconditioning; Threshold voltage hysteresis; SiC MOSFET; BTI; Vendor analysis