Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions

• Published in: Microelectronics and reliability Vol. 88-90; pp. 593 - 597
• Main Authors: Jiang, Xi, Wang, Jun, Lu, Jiwu, Chen, Jianjun, Yang, Xin, Li, Zongjian, Tu, Chunming, Shen, Z. John
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.09.2018
• Subjects: Failure analysis; Short-circuit; SiC MOSFET; Failure analysis; Short-circuit; SiC MOSFET

The preliminary characterization study and analysis of the short-circuit (SC) capability of SiC MOSFET have been reported in recent years. However, the failure modes of the SiC MOSFET under various SC conditions and their physical mechanisms are unclear. The purpose of this paper is to extensively i...