Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions - Jiang, Xi; Wang, Jun; Lu, Jiwu; Chen, Jianjun; Yang, Xin; Li, Zongjian; Tu, Chunming; Shen, Z. John (Microelectronics and reliability, 2018)
Keywords: Failure analysis; Short-circuit; SiC MOSFET; Failure analysis; Short-circuit; SiC MOSFET