Computer-aided estimation of refractive-index profile of optical waveguides from propagation-mode near field pattern

Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In this paper, a simple and effective method is proposed for estimating the index profile in the cross section of the optical waveguide. In this method the...

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Published inElectronics & communications in Japan. Part 2, Electronics Vol. 72; no. 2; pp. 1 - 10
Main Authors Sawa, Shinnosuke, Ono, Kazuo, Norimatsu, Naoki, Kakemizu, Kouji
Format Journal Article
LanguageEnglish
Published New York Wiley Subscription Services, Inc., A Wiley Company 1989
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Abstract Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In this paper, a simple and effective method is proposed for estimating the index profile in the cross section of the optical waveguide. In this method the measured field distribution of the guided mode and that calculated from the assumed index profile are compared directly and the index profile is sought for which the two field distributions coincide. To confirm the validity of the method, numerical simulations have been carried out for several graded index slab waveguides. Even if the simplest step index profile is assumed as the initial guess of the profile, the index profile of the waveguide can be estimated with practically sufficient accuracy. In this method, no differential process is needed for the measured values nor a high‐degree smoothing operation. Hence, the method is expected to be superior to others in terms of noise tolerance.
AbstractList Abstract Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In this paper, a simple and effective method is proposed for estimating the index profile in the cross section of the optical waveguide. In this method the measured field distribution of the guided mode and that calculated from the assumed index profile are compared directly and the index profile is sought for which the two field distributions coincide. To confirm the validity of the method, numerical simulations have been carried out for several graded index slab waveguides. Even if the simplest step index profile is assumed as the initial guess of the profile, the index profile of the waveguide can be estimated with practically sufficient accuracy. In this method, no differential process is needed for the measured values nor a high‐degree smoothing operation. Hence, the method is expected to be superior to others in terms of noise tolerance.
Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In this paper, a simple and effective method is proposed for estimating the index profile in the cross section of the optical waveguide. In this method the measured field distribution of the guided mode and that calculated from the assumed index profile are compared directly and the index profile is sought for which the two field distributions coincide. To confirm the validity of the method, numerical simulations have been carried out for several graded index slab waveguides. Even if the simplest step index profile is assumed as the initial guess of the profile, the index profile of the waveguide can be estimated with practically sufficient accuracy. In this method, no differential process is needed for the measured values nor a high‐degree smoothing operation. Hence, the method is expected to be superior to others in terms of noise tolerance.
Author Ono, Kazuo
Norimatsu, Naoki
Sawa, Shinnosuke
Kakemizu, Kouji
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Kazuo Ono graduated in 1970 from Dept. of Electronic Engineering, Osaka Prefectural University, and obtained an M.S. degree in 1972. In that year he became an Assistant at Ehime University, Dept. of Electronic Engineering. He has been engaged in research on optical waveguides. He has a doctorate in Engineering.
Kouji Kakemizu graduated in 1987 from Dept. of Electronic Engineering, Ehime University. He then joined Kawanoe Zoki. Presently, he is with the Third Design Section of the Design Department.
Shinnosuke Sawa graduated in 1962 from Dept. of Electrical Engineering, Osaka Prefectural University. He then affiliated with Mitsubishi Electric until 1964. In 1967, he received an M.S. degree from Osaka University and a Dr. of Engineering degree in 1970. Also, in 1970, he become an Associate Professor at Ehime University, Dept. of Electronic Engineering, and was promoted to Professor in 1976. He has been engaged in research on optical waveguides, optical integrated circuits and optical fibers. He is a member of IEEE; the Laser Society; and Institute of Electrical Engineers of Japan.
Naoki Norimatsu graduated in 1986 from Dept. of Electronic Engineering, Ehime University, and obtained an M.S. degree in 1988. In that year, he joined the Police Agency. Presently, he is with the communication department of Hyogo Prefecture.
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Snippet Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In this paper,...
Abstract Several methods have been proposed for estimating the structural parameters of a waveguide from transmission characteristics of the guided mode. In...
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Title Computer-aided estimation of refractive-index profile of optical waveguides from propagation-mode near field pattern
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