Resistive switching characteristics of methyl-ammonium lead iodide perovskite during atmosphere degradation - Wafee, Seema; Leu, Ching-Chich; Chen, Yu-Wen; Liu, Bernard Haochih (Journal of alloys and compounds, 2023)
Keywords: Conductive atomic force microscope (c-AFM); Degradation; Local current-voltage (I-V) characteristics; Methylammonium lead iodide (MAPbI3) perovskite; Resistive random access memory (RRAM); Thin films; Thin films; Local current-voltage (I-V) characteristics; Degradation; Methylammonium lead iodide (MAPbI3) perovskite; Conductive atomic force microscope (c-AFM); Resistive random access memory (RRAM)