Electrochemically induced cleavage cracking at twin boundary of sodium layered oxide cathodes

• Published in: Acta materialia Vol. 238; p. 118212
• Main Authors: Chen, Cheng, Han, Zhen, Liang, Chaoping, Feng, Yiming, Wang, Peng, Wei, Weifeng
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.10.2022
• Subjects: 4D-STEM; Cleavage cracking; Coherent twin boundary; First principles calculations; Sodium layered oxide cathode; First principles calculations; 4D-STEM; Coherent twin boundary; Cleavage cracking; Sodium layered oxide cathode

Twinning defects often present in crystalline materials when are subject to mechanical stimuli and are mostly affecting their physicochemical properties. The twinning formation and twin-assisted cracking upon cycling in sodium layered oxides (SLOs) are poorly understood. Combining atomic-resolution...