General method of specimen preparation for the quantitative microscopic characterization of nano- and microparticles

• Published in: Materials characterization Vol. 153; pp. 60 - 68
• Main Authors: Urfels, Stephan, Bauer, Johann, Vogel, Herbert
• Format: Journal Article
• Language: English
• Published: Elsevier Inc 01.07.2019
• Subjects: Computer-assisted image analysis; Nanomaterial; Particle size distribution; Quantitative microscopy; Particle size distribution; Computer-assisted image analysis; Nanomaterial; Quantitative microscopy
• ISSN: 1044-5803; 1873-4189
• DOI: 10.1016/j.matchar.2019.04.043

Nano-materials are a subject of current research and development due to their special characteristics, based on the size of their constituent particles. A major hurdle is the reliable analysis of the particle size and particle size distribution. This article introduces a new method of specimen preparation for the quantitative analysis of particle systems. Selected examples show the capabilities of computer-assisted image analysis of microscopic images. The problem of agglomeration and aggregation of primary particles is discussed and a strategy for calculating the primary particle distribution based on a mathematical model is presented. The successful, highly controlled deposition of deagglomerated nanoparticles on a microscope carrier enables a reliable particle size distribution measurement, even with strong interacting nanoparticles. [Display omitted] •Aggregated magnetic nanoparticles are broken down to its constituent particles and fixed on a sample carrier for microscopy.•Quantitative analysis of particle systems with computer-assisted image analysis of microscopic images is achieved.•Nanoparticle impurities in microparticle samples could be revealed.•Primary particle distributions based on a mathematical model are calculated.