A thyristor random access memory with localized partial insulator structure to improve retention characteristics at high temperatures - Ryu, Jaeung; Lee, Woojoo; Kwon, Ikhyeon; Cho, Il Hwan (Semiconductor science and technology, 2025)
Keywords: 1T DRAM; 2-T TRAM; localized partial insulator (LPI) structure; retention characteristics; TCAD; thyristor; TRAM